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SMARTIES
Smart Integrated Electronic Systems
Consult your copyright
Titre du journal ou ISSN
Editeur
Number of Files
217
Nomber of Notices
177
Collaborations’ map
Tags
Security
Carbon nanotube
Carbon nanotubes
Specifications
RSA
Pattern recognition
Interconnects
Integrated circuit reliability
Machine-learning algorithms
Vanadium dioxide
Digital ATE
Technology computer-aided design TCAD
Copper
Logic gates
Digital signal processing
CMOS
Bioimpedance
Low power
OQPSK
Biosensor
Hardware security
Secure IC
Electrothermal analysis
Edge artificial intelligence edge AI
Circuit simulation
Automatic test pattern generation
RF integrated circuits
Calibration
Power supplies
Integrated circuit testing
Quantum
Phase noise
Design
Current mirror
Analog/RF integrated circuits
Microprocessors
Clocks
Integrated circuit modeling
Beyond-CMOS devices
EM fault injection
SRAM
3D integration
Indirect testing
Low-cost measurements
Switches
Bioimpedance spectroscopy
Electronic tagging
Phase shifter
Reliability
Hardware
RF test
3D
Interconnect
Fault tolerance
Electrothermal simulation
Indirect test
ZigBee
SEU
Fault attacks
Noise
Side-channel analysis
Analog signals
Process variability
Sensors
Computer architecture
Self-heating
1-bit acquisition
Integrated circuit noise
Mutual information
Ensemble methods
Quantum computing
Oscillatory neural networks ONN
Three-dimensional displays
Noise measurement
Performance
Monitoring
Neuromorphic computing
FDSOI technology
Computer
Magnetic tunneling
Test confidence
Delays
Through-silicon vias
Test
Transistors
EVM measurement
MEMS
Bandwidth
Education
Test cost reduction
Insulator-Metal-Transition IMT
Integrated circuit design
Integrated circuit interconnections
Integrated circuits
Self-oscillations
Test efficiency
Circuit faults
Evaluation
One bit acquisition
Alternate testing