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 Smart Integrated Electronic Systems

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Quantum computing Power supplies Bioimpedance spectroscopy Integrated circuit modeling Indirect test Beyond-CMOS devices Thermal sensor Integrated circuit design Noise measurement Technology computer-aided design TCAD Phase noise Interconnect Analog signals MEMS Design Calibration RF integrated circuits Neuromorphic computing Ensemble methods Self-heating Phase shifter Logic gates Low-cost measurements Computer architecture Electrothermal simulation RF test Pattern recognition Specifications Transistors Magnetic tunneling Delays Circuit faults Switches Temperature distribution Time-domain analysis Digital ATE Integrated circuit interconnections Through-silicon vias Three-dimensional displays Integrated circuit reliability Electrothermal analysis Analytical models Microprocessors OQPSK Edge artificial intelligence edge AI Machine-learning algorithms Carbon nanotubes Power demand ZigBee Monitoring SEU Integrated circuit noise Fault tolerance Sensors Alternate test Test Bioimpedance Integrated circuits Test confidence Advanced PMA STT-MRAM Education 3D Copper Analog/RF integrated circuits Evaluation CMOS Test cost reduction 1-bit acquisition Low power Integrated circuit testing Process variability Analog/IF signals Digital signal processing Secure IC Three-dimensional integrated circuits Vanadium dioxide BIST Noise Carbon nanotube 3D integration Analog and RF integrated circuits Bandwidth Oscillatory neural networks ONN Side-channel analysis Test efficiency Security Alternate testing Reliability Self-oscillations One bit acquisition FDSOI technology SRAM Automatic test pattern generation Clocks Accelerometer ATE programming Indirect testing RSA Circuit simulation Interconnects