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 Smart Integrated Electronic Systems

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Security Carbon nanotube Carbon nanotubes Specifications RSA Pattern recognition Interconnects Integrated circuit reliability Machine-learning algorithms Vanadium dioxide Digital ATE Technology computer-aided design TCAD Copper Logic gates Digital signal processing CMOS Bioimpedance Low power OQPSK Biosensor Hardware security Secure IC Electrothermal analysis Edge artificial intelligence edge AI Circuit simulation Automatic test pattern generation RF integrated circuits Calibration Power supplies Integrated circuit testing Quantum Phase noise Design Current mirror Analog/RF integrated circuits Microprocessors Clocks Integrated circuit modeling Beyond-CMOS devices EM fault injection SRAM 3D integration Indirect testing Low-cost measurements Switches Bioimpedance spectroscopy Electronic tagging Phase shifter Reliability Hardware RF test 3D Interconnect Fault tolerance Electrothermal simulation Indirect test ZigBee SEU Fault attacks Noise Side-channel analysis Analog signals Process variability Sensors Computer architecture Self-heating 1-bit acquisition Integrated circuit noise Mutual information Ensemble methods Quantum computing Oscillatory neural networks ONN Three-dimensional displays Noise measurement Performance Monitoring Neuromorphic computing FDSOI technology Computer Magnetic tunneling Test confidence Delays Through-silicon vias Test Transistors EVM measurement MEMS Bandwidth Education Test cost reduction Insulator-Metal-Transition IMT Integrated circuit design Integrated circuit interconnections Integrated circuits Self-oscillations Test efficiency Circuit faults Evaluation One bit acquisition Alternate testing