Hardware Heavy ions Fault attacks Soft Error Rate Low power Design space exploration Fault tolerance Accelerometers Sensors Transient faults Transistors VLSI Simulation Computer architecture Crosstalk Flip-flops SER Memory Security Design Fiabilité Hardware security Memory device SoC Integrated circuit interconnections Testability Automatic test pattern generation Countermeasures Robustness BIST Neutron Logic testing Memory test Circuit faults Temperature distribution Silicon Integrated circuit modeling Memories MRAM Integrated circuit design Multiple cell upset MCU Through-silicon vias CMOS integrated circuits FPGA Cryptographie Field programmable gate arrays Noise ATPG Microprocessors Monitoring Clocks 3D integration Reliability Cross section Heating 3D Architecture Analytical models DPA Failure analysis DFT Variability Neutrons Low-power design Aging Fault modeling Cryptography Cross-section Random access memory Delay testing Single event upset SEU Integrated circuit testing Libraries Radiation Logic gates Test Embedded systems Switches CMOS Calibration SRAM SEU Soft errors Magnetic tunneling RSA MEMS Atmospheric neutrons Single Event Upset Testing Delays Fault injection Modeling Thermal sensor Core-cell Diagnostic Power demand AES Electromagnetic Analysis Accelerometer Hardware Trojan