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 Test and dEpendability of microelectronic integrated SysTems

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Approximate computing Diffusion model BIST Test Atmospheric neutrons Logic gates Radiation SER Libraries Integrated circuit testing Circuit faults Power supplies One bit acquisition Indirect testing Laser Analytical models Delays ATPG Alternate testing Switches Test cost reduction OQPSK Software Monitoring Through-silicon vias Digital signal processing FDSOI Diagnosis Integrated circuits Single event upset SEU Flip-flops RF integrated circuits Simulation Testing Fault tolerance Integrated circuit modeling Stream Cipher Machine-learning algorithms Fault simulation Phase noise Transient faults Memories Power demand Noise measurement Microprocessor chips Security Test and Security 3D integration Power consumption Fault injection Approximate Computing Reliability Ensemble methods Microprocessors Combinational circuits Analog signals Soft errors Digital ATE JTAG Neutrons Scan Encryption Transistors COTS Computer architecture Cross section Heavy ions Machine Learning Hardware Trojan Hardware Security Test efficiency Education Fault tolerant systems Fiabilité Multiple cell upset MCU Protons Computational modeling Logic testing Random access memory SEU RF test Hardware security Integrated circuit reliability Integrated circuit design ZigBee Automatic test pattern generation Fault attacks Soft error SRAM 1-bit acquisition Clocks Particle detector Analog/RF integrated circuits Scan Attacks Countermeasure Hardware Fault Injection Estimation Process variability Radiation hardening Silicon Transient analysis