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 Test and dEpendability of microelectronic integrated SysTems

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Radiation Radiation effects Dynamic test Data retention SEU OQPSK Ensemble methods Indirect test Integrated circuit testing Scan Encryption Neutrons JTAG Design-for-Trust RF test Fault tolerance Logic gates Analog signals Education Fault Injection Clocks Hardware security Fault-tolerance Security Microprocessors Digital ATE Context saving Memories Flash memory One bit acquisition Machine-learning algorithms Radiation hardening COTS Fault injection FDSOI Integrated circuits Automatic test pattern generation Indirect testing Light Encryption RF integrated circuits Test efficiency Circuit faults BIST SRAM Test and Security Computer architecture Delays Test Evaluation Low-cost measurements 1-bit acquisition Circuit reliability Test cost reduction Laser Scan Attacks Countermeasure Integrated circuit noise Dependability Reliability Combinational circuits Test confidence Functional approximation Phase noise Power supplies Diagnosis SEE CMOS ZigBee Testing ATPG Approximate computing Hardware Software Noise measurement Functional test Analog/RF integrated circuits Intra-cell defects Customer returns Power demand RISC-V IoT Stream Cipher Latch design Alternate testing Integrated circuit modeling Switches Double-node upset Machine Learning Soft error Memory Fault Tolerance Digital modulation Multiple cell upset MCU Silicon Digital signal processing Transistors Single event upset SEU 3D integration Laser fault injection EVM measurement Integrated circuit reliability Approximate Computing