Conference Papers
Year : 2010
Karim Inal : Connect in order to contact the contributor
https://hal-emse.ccsd.cnrs.fr/emse-00533813
Submitted on : Monday, November 8, 2010-1:13:03 PM
Last modification on : Tuesday, September 17, 2024-3:45:08 PM
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Romuald Roucou, Vincent Fiori, Karim Inal, Hervé Jaouen. Mechanical Issues Induced by Electrical Wafer Sort: Correlations from actual tests, Nanoindentation and 3D Dynamic Modeling. Electronics System Integration Technology Conference ESTC 2010, Sep 2010, Berlin, Germany. pp.P0027, ⟨10.1109/ESTC.2010.5642863⟩. ⟨emse-00533813⟩
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