Characterization by thermostimulated exoelectronic emission of thin alpha-alumina particles obtained through comminution

Abstract : This study was concerned with the evolution that occured during alpha alumina comminution (either polycrystalline or monocrystalline, doped or non-doped alpha alumina). Comminution of polycrystalline alumina shows that the evolution of the stresses detected through triboemission is not monotonic as a function of the duration of the mechanical treatment. These stresses and those measured through X-Ray broadening do not seem to be of the same origin. Triboemission signals transmitted by monocrystalline alumina are different, but the same evolution is observed through comminution. Besides, the evolution of stresses detected through X-Ray broadening is different. Doping of monocrystalline alpha alumina (30 ppm Cr3+) does not provoke any significant changes when compared to undoped alpha alumina, as regards evolution during the comminution process. On the other hand, the T.S.E.E. signal has practically disappeared for a 2000 ppm Cr3+ content, and the evolutions of the stresses detected through T.E. and X-Ray broadening seem to be more complex.
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Article dans une revue
Cim Bulletin, Canadian Institute of Mining and Metallurgy, 1988, 81 (914), pp.57
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https://hal-emse.ccsd.cnrs.fr/emse-00569467
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Soumis le : vendredi 25 février 2011 - 11:01:35
Dernière modification le : mardi 23 octobre 2018 - 14:36:06

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  • HAL Id : emse-00569467, version 1

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Daniel Daviller, Daniel Turpin, Bernard Guilhot. Characterization by thermostimulated exoelectronic emission of thin alpha-alumina particles obtained through comminution. Cim Bulletin, Canadian Institute of Mining and Metallurgy, 1988, 81 (914), pp.57. 〈emse-00569467〉

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