Electromagnetic Transient Faults Injection on a hardware and software implementations of AES

Abstract : This paper considers the use of electromagnetic pulses (EMP) to inject transient faults into the calculations of a hardware and a software AES. A pulse generator and a 500μm- diameter magnetic coil were used to inject the localized EMP disturbances without any physical contact with the target. EMP injections were performed against a software AES running on a CPU , and a hardware AES (with and without countermeasure) embedded in a FPGA. The purpose of this work was twofold: (a) reporting actual faults injection induced by EMPs in our targets and describing their main properties; (b) explaining the coupling mechanism between the antenna used to produce the EMP and the targeted circuit, which causes the faults. The obtained results revealed a localized effect of the EMP since the injected faults were found dependent on the spatial position of the antenna on top of the circuit's surface. The assumption that EMP faults are related to the violation of the target's timing constraints was also studied and ascertained thanks to the use of a countermeasure based on monitoring such timing violations.
Type de document :
Communication dans un congrès
FDTC 2012, Sep 2012, Leuven, Belgium. pp.7, 2012
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https://hal-emse.ccsd.cnrs.fr/emse-00742639
Contributeur : Hélène Le Bouder <>
Soumis le : mardi 16 octobre 2012 - 17:12:17
Dernière modification le : mercredi 14 février 2018 - 14:05:10

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  • HAL Id : emse-00742639, version 1

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Amine Dehbaoui, Jean-Max Dutertre, Bruno Robisson, Assia Tria. Electromagnetic Transient Faults Injection on a hardware and software implementations of AES. FDTC 2012, Sep 2012, Leuven, Belgium. pp.7, 2012. 〈emse-00742639〉

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