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EM Probes Characterisation for Security Analysis

Abstract : Along with the vast use of cryptography in security devices came the emergence of attacks like Electro-Magnetic analysis (EMA) where the measurement of the Electro-Magnetic (EM) waves radiated from an integrated circuit are used to extract sensitive information. Several research papers have covered EMA but very few have focused on the probes used. In this paper we detail an approach for analysing different probes for EMA. We perform the characterisation of several EM probes on elementary circuits like an isolated copper wire and silicon lines. We then illustrate how EM probes can be characterised based on data dependant information leakage of integrated circuits by doing measurements on a smart card like chip. We show that the latter results are in line with those obtained from the measurements on the elementary circuits, onto which detailed and more precise analyses can be carried.
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Contributor : Hélène Le Bouder Connect in order to contact the contributor
Submitted on : Wednesday, October 17, 2012 - 11:09:55 AM
Last modification on : Wednesday, June 24, 2020 - 4:18:19 PM


  • HAL Id : emse-00742768, version 1


Benjamin Mounier, Anne-Lise Ribotta, Jacques Jean-Alain Fournier, Michel Agoyan, Assia Tria. EM Probes Characterisation for Security Analysis. Cryptography and Security: From Theory to Applications, 2012, pp.248-264. ⟨emse-00742768⟩



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