Data Mining, 2000. ,
DOI : 10.1007/978-1-4899-7993-3_104-2
The interingness of deviations, Proc. KDD Workshop, pp.25-36, 1994. ,
A data mining methodology and its application to semi-automatic knowledge acquisition, Database and Expert Systems Applications. 8th International Conference, DEXA '97. Proceedings, pp.670-677, 1997. ,
DOI : 10.1109/DEXA.1997.617410
Data mining in manufacturing: a review based on the kind of knowledge, Journal of Intelligent Manufacturing, vol.24, issue.3, pp.501-521, 2009. ,
DOI : 10.1007/s10845-008-0145-x
Implementing virtual metrology for in-line quality control in semiconductor manufacturing, International Journal of Systems Science, vol.19, issue.5, pp.461-470, 2009. ,
DOI : 10.1109/TSM.2007.907609
Data Mining and Diagnosing IC Fails, 2005. ,
Manufacturing Yield Improvement by Clustering, Proc. ICONIP, pp.526-534, 2006. ,
DOI : 10.1007/11893295_58
Data mining for improving a cleaning process in the semiconductor industry, IEEE Transactions on Semiconductor Manufacturing, vol.15, issue.1, pp.91-101, 2002. ,
DOI : 10.1109/66.983448
On the use of decision tree induction for discovery of interactions in a photolithographic process, IEEE Transactions on Semiconductor Manufacturing, vol.16, issue.4, pp.644-652, 2003. ,
DOI : 10.1109/TSM.2003.818959
Application of Data Mining for Improving Yield in Wafer Fabrication System, Proc. ICCSA,v o l .4, pp.222-231, 2005. ,
DOI : 10.1007/11424925_25
An Example Inference Task: Clustering, pp.284-292, 2003. ,
Data mining for yield enhancement in semiconductor manufacturing and an empirical study, Expert Systems with Applications, vol.33, issue.1, pp.192-198, 2007. ,
DOI : 10.1016/j.eswa.2006.04.014
Data Mining for Improving the Quality of Manufacturing: A Feature Set Decomposition Approach, Journal of Intelligent Manufacturing, vol.19, issue.7, pp.285-299, 2006. ,
DOI : 10.1007/s10845-005-0005-x
Application of new a priori algorithm MDNC to TFT-LCD array manufacturing yield improvement ,
A novel manufacturing defect detection method using association rule mining techniques, Expert Systems with Applications, vol.29, issue.4, pp.807-815, 2005. ,
DOI : 10.1016/j.eswa.2005.06.004
Data mining algorithm for manufacturing process control, The International Journal of Advanced Manufacturing Technology, vol.28, issue.3-4, pp.3-4, 2006. ,
DOI : 10.1007/s00170-004-2367-1
URL : http://deepblue.lib.umich.edu/bitstream/2027.42/45889/1/170_2004_Article_2367.pdf
Formal Concept Analysis: Mathematical Foundations, 1999. ,
Beyond market baskets: Generalizing association rules to correlations, Proc. SIGMOD Conf, pp.265-276, 1997. ,
Computing Full and Iceberg Datacubes Using Partitions, Proc. ISMIS, pp.244-254, 2002. ,
DOI : 10.1007/3-540-48050-1_28
URL : http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.468.7208
Fast discovery of association rules, Advances in Knowledge Discovery and Data Mining, pp.307-328, 1996. ,
Efficient mining of both positive and negative association rules, ACM Transactions on Information Systems, vol.22, issue.3, pp.381-405, 2004. ,
DOI : 10.1145/1010614.1010616
Efficient mining of constrained correlated sets, Proceedings of 16th International Conference on Data Engineering (Cat. No.00CB37073), pp.512-521, 2000. ,
DOI : 10.1109/ICDE.2000.839450
Theory of Convex Structures, 1993. ,
Generalizing version spaces, Machine Learning, vol.2, issue.1, pp.5-46, 1994. ,
DOI : 10.1007/BF00993863
Outline of Statistics, 1998. ,
Measures of lack of fit from tests of chi-squared type, Proc. EGC, pp.151-166, 1984. ,
DOI : 10.1016/0378-3758(84)90067-3
Partition semantics for incomplete information in relational databases, Proc. SIGMOD Conf, pp.66-73, 1988. ,
Levelwise search and borders of theories in knowledge discovery, Data Mining and Knowledge Discovery, vol.1, issue.3, pp.241-258, 1997. ,
DOI : 10.1023/A:1009796218281
A Thorough Experimental Study of Datasets for Frequent Itemsets, Fifth IEEE International Conference on Data Mining (ICDM'05), pp.162-169, 2005. ,
DOI : 10.1109/ICDM.2005.15
Data Preparation for Data Mining, 1999. ,
Preprocessing for data mining and decision support, " in Data Mining and Decision Support: Integration and Collaboration The Netherlands, pp.107-117, 2003. ,
Discretization: An enabling technique, Data Mining and Knowledge Discovery, vol.6, issue.4, pp.393-423, 2002. ,
DOI : 10.1023/A:1016304305535
The data model concept in statistical mapping, International Yearbook of Cartography, pp.186-190, 1967. ,
On Grouping for Maximum Homogeneity, Journal of the American Statistical Association, vol.40, issue.284, pp.789-798, 1958. ,
DOI : 10.2307/1907923
Data Mining, 2000. ,
DOI : 10.1007/978-1-4899-7993-3_104-2
The interingness of deviations, Proc. KDD Workshop, pp.25-36, 1994. ,
A data mining methodology and its application to semi-automatic knowledge acquisition, Database and Expert Systems Applications. 8th International Conference, DEXA '97. Proceedings, pp.670-677, 1997. ,
DOI : 10.1109/DEXA.1997.617410
Data mining in manufacturing: a review based on the kind of knowledge, Journal of Intelligent Manufacturing, vol.24, issue.3, pp.501-521, 2009. ,
DOI : 10.1007/s10845-008-0145-x
Implementing virtual metrology for in-line quality control in semiconductor manufacturing, International Journal of Systems Science, vol.19, issue.5, pp.461-470, 2009. ,
DOI : 10.1109/TSM.2007.907609
Data Mining and Diagnosing IC Fails, 2005. ,
Manufacturing Yield Improvement by Clustering, Proc. ICONIP, pp.526-534, 2006. ,
DOI : 10.1007/11893295_58
Data mining for improving a cleaning process in the semiconductor industry, IEEE Transactions on Semiconductor Manufacturing, vol.15, issue.1, pp.91-101, 2002. ,
DOI : 10.1109/66.983448
On the use of decision tree induction for discovery of interactions in a photolithographic process, IEEE Transactions on Semiconductor Manufacturing, vol.16, issue.4, pp.644-652, 2003. ,
DOI : 10.1109/TSM.2003.818959
Application of Data Mining for Improving Yield in Wafer Fabrication System, Proc. ICCSA,v o l .4, pp.222-231, 2005. ,
DOI : 10.1007/11424925_25
An Example Inference Task: Clustering, pp.284-292, 2003. ,
Data mining for yield enhancement in semiconductor manufacturing and an empirical study, Expert Systems with Applications, vol.33, issue.1, pp.192-198, 2007. ,
DOI : 10.1016/j.eswa.2006.04.014
Data Mining for Improving the Quality of Manufacturing: A Feature Set Decomposition Approach, Journal of Intelligent Manufacturing, vol.19, issue.7, pp.285-299, 2006. ,
DOI : 10.1007/s10845-005-0005-x
Application of new a priori algorithm MDNC to TFT-LCD array manufacturing yield improvement ,
A novel manufacturing defect detection method using association rule mining techniques, Expert Systems with Applications, vol.29, issue.4, pp.807-815, 2005. ,
DOI : 10.1016/j.eswa.2005.06.004
Data mining algorithm for manufacturing process control, The International Journal of Advanced Manufacturing Technology, vol.28, issue.3-4, pp.3-4, 2006. ,
DOI : 10.1007/s00170-004-2367-1
Formal Concept Analysis: Mathematical Foundations, 1999. ,
Beyond market baskets: Generalizing association rules to correlations, Proc. SIGMOD Conf, pp.265-276, 1997. ,
Computing Full and Iceberg Datacubes Using Partitions, Proc. ISMIS, pp.244-254, 2002. ,
DOI : 10.1007/3-540-48050-1_28
URL : http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.468.7208
Fast discovery of association rules, Advances in Knowledge Discovery and Data Mining, pp.307-328, 1996. ,
Efficient mining of both positive and negative association rules, ACM Transactions on Information Systems, vol.22, issue.3, pp.381-405, 2004. ,
DOI : 10.1145/1010614.1010616
Efficient mining of constrained correlated sets, Proceedings of 16th International Conference on Data Engineering (Cat. No.00CB37073), pp.512-521, 2000. ,
DOI : 10.1109/ICDE.2000.839450
Theory of Convex Structures, 1993. ,
Generalizing version spaces, Machine Learning, vol.2, issue.1, pp.5-46, 1994. ,
DOI : 10.1007/BF00993863
Outline of Statistics, 1998. ,
Measures of lack of fit from tests of chi-squared type, Proc. EGC, pp.151-166, 1984. ,
DOI : 10.1016/0378-3758(84)90067-3
Partition semantics for incomplete information in relational databases, Proc. SIGMOD Conf, pp.66-73, 1988. ,
Levelwise search and borders of theories in knowledge discovery, Data Mining and Knowledge Discovery, vol.1, issue.3, pp.241-258, 1997. ,
DOI : 10.1023/A:1009796218281
A Thorough Experimental Study of Datasets for Frequent Itemsets, Fifth IEEE International Conference on Data Mining (ICDM'05), pp.162-169, 2005. ,
DOI : 10.1109/ICDM.2005.15
Data Preparation for Data Mining, 1999. ,
Preprocessing for data mining and decision support, " in Data Mining and Decision Support: Integration and Collaboration The Netherlands, pp.107-117, 2003. ,
Discretization: An enabling technique, Data Mining and Knowledge Discovery, vol.6, issue.4, pp.393-423, 2002. ,
DOI : 10.1023/A:1016304305535
The data model concept in statistical mapping, International Yearbook of Cartography, pp.186-190, 1967. ,
On Grouping for Maximum Homogeneity, Journal of the American Statistical Association, vol.40, issue.284, pp.789-798, 1958. ,
DOI : 10.2307/1907923