Loic Zussa, Jean-Max Dutertre, Jessy Clediere, Bruno Robisson. Analysis of the fault injection mechanism related to negative and positive power supply glitches using an on-chip voltmeter.
IEEE Int. Symposium on Hardware-Oriented Security and Trust (HOST), May 2014, Arlington, France.
⟨10.1109/HST.2014.6855583⟩.
⟨emse-01099010⟩