Analysis of the fault injection mechanism related to negative and positive power supply glitches using an on-chip voltmeter

Abstract : Power supply underpowering and negative power supply glitches are commonly used for the purpose of injecting faults into secure circuits. The related fault injection mechanism has been extensively studied: it is based on setup time violations. Positive power supply glitches are also used to inject faults. However, an increase of the supply voltage is not consistent with a mechanism based on setup time violation. Besides, no research work has yet identified the corresponding mechanism. In this work, we report the use of an embedded delay-meter to monitor the core voltage of a programmable device exposed to power supply glitches. It permitted us to gain a further insight into the mechanism associated with power glitches and also to identify the injection mechanism of positive power supply glitches.
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Communication dans un congrès
IEEE Int. Symposium on Hardware-Oriented Security and Trust (HOST), May 2014, Arlington, France. 〈10.1109/HST.2014.6855583〉
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https://hal-emse.ccsd.cnrs.fr/emse-01099010
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Dernière modification le : mardi 23 octobre 2018 - 14:36:11
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Loic Zussa, Jean-Max Dutertre, Jessy Clediere, Bruno Robisson. Analysis of the fault injection mechanism related to negative and positive power supply glitches using an on-chip voltmeter. IEEE Int. Symposium on Hardware-Oriented Security and Trust (HOST), May 2014, Arlington, France. 〈10.1109/HST.2014.6855583〉. 〈emse-01099010〉

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