Design of Bulk Built-In Current Sensors to Detect Single Event Effects and Laser-Induced Fault Injection Attempts - Mines Saint-Étienne Access content directly
Conference Papers Year : 2014

Design of Bulk Built-In Current Sensors to Detect Single Event Effects and Laser-Induced Fault Injection Attempts

Abstract

Bulk Built-In Current Sensors (BBICS) are fault detection mechanisms embedded in integrated systems. BBICS are able to monitor anomalous transient currents like the so-called single event effects induced by radiation or even malicious injection sources. This work reviews BBICS principles and introduce new sensor architectures that improve the transient-fault detection sensitivity. In addition, a test chip is presented for the validation of the sensor concept under the laser-induced effects.
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Dates and versions

emse-01099040 , version 1 (07-01-2015)

Identifiers

  • HAL Id : emse-01099040 , version 1

Cite

Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Giorgio Di Natale, et al.. Design of Bulk Built-In Current Sensors to Detect Single Event Effects and Laser-Induced Fault Injection Attempts. Joint MEDIAN–TRUDEVICE Open Forum, Sep 2014, Amsterdam, Netherlands. ⟨emse-01099040⟩
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