.. Minixhofer, TCAD as an integral part of the semiconductor manufacturing environment, 2006 International Conference on Simulation of Semiconductor Processes and Devices, pp.9-16, 2006.
DOI : 10.1109/SISPAD.2006.282827

. A. Glowacki, Expanding the scope of laser stimulation techniques for functional analysis and reliability of semiconductor devices by in-depth investigation of the optical interaction with the devices, 2010.

A. .. Llido, O. Sarafianos, V. Gagliano, V. Serradeil, M. Goubier et al., Characterization and TCAD simulation of 90 nm technology transistors under continous photoelectric laser stimulation for failure analysis improvement, 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
DOI : 10.1109/IPFA.2012.6306298

S. A. Glowacki, H. Brahma, C. Suzuki, and . Boit, Systematic Characterization of Integrated Circuit Standard Components as Stimulated by Scanning Laser Beam, IEEE Transactions on Device and Materials Reliability, vol.7, issue.1
DOI : 10.1109/TDMR.2007.900056

R. .. Sanchez, F. Deplats, P. Beaudoin, D. Perdu, P. Lewis et al., Delay variation mapping induced by dynamic laser stimulation, 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual., pp.305-311, 2005.
DOI : 10.1109/RELPHY.2005.1493103

URL : https://hal.archives-ouvertes.fr/hal-00401387

J. .. Llido, V. Gomez, G. Goubier, V. Haller, D. Pouget et al., Improving defect localization techniques with laser beam with specific analysis and set-up modules, 2012 IEEE International Reliability Physics Symposium (IRPS)
DOI : 10.1109/IRPS.2012.6241903

URL : https://hal.archives-ouvertes.fr/hal-00988382

R. Llido, A. Sarafianos, O. Gagliano, V. Serradeil, V. Goubier et al., Characterization and TCAD Simulation of 90nm Technology PMOS Transistor Under Continuous Photoelectric Laser Stimulation for Failure Analysis Improvement, Proceedings of IEEE International Reliability Physics Symposium (ESREF), « in press
URL : https://hal.archives-ouvertes.fr/emse-01130626

A. Sarafianos, R. Llido, O. Gagliano, V. Serradeil, M. Lisart et al., Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90nm technology, Proceedings of IEEE International Reliability Physics Symposium (ESREF), « in press
DOI : 10.1016/j.microrel.2012.06.047

URL : https://hal.archives-ouvertes.fr/emse-01110360