A SEU Hardened CMOS Data Latch Design, IEEE Trans. Nucl. Sci, vol.356, pp.1682-1687, 1988. ,
Single Event Upset in Irradiated 16k CMOS SRAMs, IEEE Trans. Nucl. Sci, pp.35-41, 1988. ,
SEU Characterisation of Hardened CMOS SRAMs Using Statistical Analysis of Feedback Delay in Memory Cells, IEEE Trans. Nucl. Sci, pp.36-42, 1989. ,
SEU simulation and testing of resistor-hardened D-latches in the SA3300 microprocessor, IEEE Transactions on Nuclear Science, vol.38, issue.6, pp.38-44, 1991. ,
DOI : 10.1109/23.124141
On the suitability of non-hardened high density SRAMs for space applications, IEEE Transactions on Nuclear Science, vol.38, issue.6, pp.38-44, 1991. ,
DOI : 10.1109/23.124139
Design And Testing Of SEU/ SEL Immune Memory And Logic Circuits In A Commercial Cmos Process, 1993 IEEE Radiation Effects Data Workshop, pp.51-55, 1994. ,
DOI : 10.1109/REDW.1993.700568
Two CMOS memory cells suitable for the design of SEU-tolerant VLSI circuits, IEEE Transactions on Nuclear Science, vol.41, issue.6, pp.41-47, 1994. ,
DOI : 10.1109/23.340567
Cath brasFlip-flop Hardening for Space Applications, IEEE Proceedings of the International Workshop on Memory Technology, Design, and Testing, pp.104-107, 1998. ,
A digital CMOS design technique for SEU hardening, IEEE Transactions on Nuclear Science, vol.47, issue.6, pp.47-62603, 2000. ,
DOI : 10.1109/23.903815
SEU-hardened storage cell validation using a pulsed laser, IEEE Transactions on Nuclear Science, vol.43, issue.6, pp.43-49, 1996. ,
DOI : 10.1109/23.556875
URL : https://hal.archives-ouvertes.fr/hal-01412462
Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies, IEEE Transactions on Nuclear Science, vol.41, issue.6, pp.41-47, 1994. ,
DOI : 10.1109/23.340618
Implications of the spatial dependence of the single-event-upset threshold in SRAMs measured with a pulsed laser, IEEE Transactions on Nuclear Science, vol.41, issue.6, pp.41-47, 1994. ,
DOI : 10.1109/23.340562
Laboratory tests for single-event effects, IEEE Transactions on Nuclear Science, vol.43, issue.2, pp.678-686, 1996. ,
DOI : 10.1109/23.490911
Application of Pulsed Laser for Evaluation and Optimization of SEU-Hard Designs, IEEE Trans. Nucl. Sci, pp.47-50, 2000. ,
Application of laser testing in study of SEE mechanisms in 16-Mbit DRAMs, IEEE Transactions on Nuclear Science, vol.47, issue.6, pp.47-53, 2000. ,
DOI : 10.1109/23.903782
SEU testing of a novel hardened register implemented using standard CMOS technology, IEEE Transactions on Nuclear Science, vol.46, issue.6, pp.46-52, 1999. ,
DOI : 10.1109/23.819105
URL : https://hal.archives-ouvertes.fr/hal-00008234