Satellite Anomalies from Galactic Cosmic Rays, IEEE Transactions on Nuclear Science, vol.22, issue.6, pp.2675-2680, 1975. ,
DOI : 10.1109/TNS.1975.4328188
Single event upset at ground level, IEEE Transactions on Nuclear Science, vol.43, issue.6, pp.2742-2750, 1996. ,
DOI : 10.1109/23.556861
Radiation-induced soft errors in advanced semiconductor technologies, IEEE Transactions on Device and Materials Reliability, vol.5, issue.3, pp.305-316, 2005. ,
DOI : 10.1109/TDMR.2005.853449
The Use of Lasers to Simulate Radiation-Induced Transients in Semiconductor Devices and Circuits, IEEE Transactions on Nuclear Science, 1965. ,
DOI : 10.2172/4609524
Pulsed-Laser Testing for Single-Event Effects Investigations, IEEE Transactions on Nuclear Science, vol.60, issue.3, pp.1852-1875, 2013. ,
DOI : 10.1109/TNS.2013.2255312
Optical Fault Induction Attacks, 4th International Workshop on Cryptographic Hardware and Embedded Systems, ser. CHES '02, pp.2-12, 2002. ,
DOI : 10.1007/3-540-36400-5_2
URL : http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.9.5680
Fault Injection Attacks on Cryptographic Devices: Theory, Practice, and Countermeasures, Proceedings of the IEEE, pp.3056-3076, 2012. ,
DOI : 10.1109/JPROC.2012.2188769
URL : https://hal.archives-ouvertes.fr/hal-01110932
An Efficient BICS Design for SEUs Detection and Correction in Semiconductor Memories, Europe Conference and Exhibition (DATE), 2005. ,
URL : https://hal.archives-ouvertes.fr/hal-00181657
SEU-tolerant SRAM design based on current monitoring, Proceedings of IEEE 24th International Symposium on Fault- Tolerant Computing, pp.106-115, 1994. ,
DOI : 10.1109/FTCS.1994.315652
URL : https://hal.archives-ouvertes.fr/hal-00013937
Using Bulk Built-in Current Sensors to Detect Soft Errors, 18th Symposium on Integrated Circuits and Systems Design, pp.10-18, 2006. ,
DOI : 10.1109/MM.2006.103
Tbulk-BICS: A built-in current sensor robust to process and temperature variations for SET detection, 2007 9th European Conference on Radiation and Its Effects on Components and Systems, 2007. ,
DOI : 10.1109/RADECS.2007.5205469
A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients, Journal of Electronic Testing, vol.26, issue.6, 2013. ,
DOI : 10.1007/s10836-013-5364-1
Building the electrical model of the pulsed photoelectric laser stimulation of an NMOS transistor in 90nm technology, 2013 IEEE International Reliability Physics Symposium (IRPS), pp.5-5, 2013. ,
DOI : 10.1109/IRPS.2013.6532028
URL : https://hal.archives-ouvertes.fr/emse-01130636
Building the electrical model of the pulsed photoelectric laser stimulation of a PMOS transistor in 90nm technology, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), pp.22-27, 2013. ,
DOI : 10.1109/IPFA.2013.6599120
Robustness improvement of an SRAM cell against laser-induced fault injection, 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), pp.149-154, 2013. ,
DOI : 10.1109/DFT.2013.6653598
URL : https://hal.archives-ouvertes.fr/emse-01109141
Characterization and simulation of a body biased structure in triple-well technology under pulsed photoelectric laser stimulation, International Symposium for Testing and Failure Analysis (ISTFA), 2014. ,
URL : https://hal.archives-ouvertes.fr/emse-01099035
Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), pp.1320-1324, 2013. ,
DOI : 10.1016/j.microrel.2013.07.069
URL : https://hal.archives-ouvertes.fr/emse-01100723
Simulation Evaluation of an Implemented Set of Complementary Bulk Built-In Current Sensors With Dynamic Storage Cell, IEEE Transactions on Device and Materials Reliability, vol.14, issue.1, pp.255-261, 2014. ,
DOI : 10.1109/TDMR.2013.2252176
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), 2014. ,
DOI : 10.1016/j.microrel.2014.07.151
URL : https://hal.archives-ouvertes.fr/emse-01094805
A new Bulk Built-In Current Sensing circuit for single-event transient detection, CCECE 2010, pp.4-7, 2010. ,
DOI : 10.1109/CCECE.2010.5575124
Bulk built in current sensors for single event transient detection in deep-submicron technologies, Microelectronics Reliability, vol.48, issue.5, pp.710-715, 2008. ,
DOI : 10.1016/j.microrel.2008.01.002
by using Modular Built-In Current Sensors, 25th Symposium on Integrated Circuits and Systems Design (SBCCI), 2012. ,
URL : https://hal.archives-ouvertes.fr/hal-00920428
A Bulk Built-in Current Sensor for SET detection with dynamic memory cell, 2012 IEEE 3rd Latin American Symposium on Circuits and Systems (LASCAS), pp.1-4, 2013. ,
DOI : 10.1109/LASCAS.2012.6180338
A bulk built-in sensor for detection of fault attacks, 2013 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), pp.4-7, 2013. ,
DOI : 10.1109/HST.2013.6581565
URL : https://hal.archives-ouvertes.fr/lirmm-01430800