D. Binder, E. C. Smith, and A. B. Holman, Satellite Anomalies from Galactic Cosmic Rays, IEEE Transactions on Nuclear Science, vol.22, issue.6, pp.2675-2680, 1975.
DOI : 10.1109/TNS.1975.4328188

T. C. May and M. H. Woods, Alpha-particle-induced soft errors in dynamic memories, IEEE Transactions on Electron Devices, vol.26, issue.1, pp.2-9, 1979.
DOI : 10.1109/T-ED.1979.19370

D. Habing and M. H. Woods, The Use of Lasers to Simulate Radiation-Induced Transients in Semiconductor Devices and Circuits, IEEE Transactions on Nuclear Science, 1965.

A. M. Glowacki, S. K. Brahma, H. Suzuki, and C. Boit, Systematic Characterization of Integrated Circuit Standard Components as Stimulated by Scanning Laser Beam, IEEE Transactions on Device and Materials Reliability, vol.7, issue.1, 2010.
DOI : 10.1109/TDMR.2007.900056

K. Haraguchi, Microscopic optical seam induced current measurements and their applications, Proc. of 10th IEEE IMTC, pp.693-699, 1994.

L. Hériveaux, J. Clédière, and S. Anceau, Electrical Modeling of the Effect of Photoelectric Laser Fault Injection on Bulk CMOS Design

D. Liu and C. Svensson, Trading speed for low power by choice of supply and threshold voltages, IEEE Journal of Solid-State Circuits, vol.28, issue.1, 1993.
DOI : 10.1109/4.179198

A. Keshavarzi, S. Narendra, S. Borkar, C. Hawkind, K. Roy et al., Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC's, Proceedings of the 1999 international symposium on Low power electronics and design , ISLPED '99, p.252, 1999.
DOI : 10.1145/313817.313937

A. Sarafianos, O. Gagliano, V. Serradeil, M. Lisart, J. Dutertre et al., Building the electrical model of the pulsed photoelectric laser stimulation of an NMOS transistor in 90nm technology, 2013 IEEE International Reliability Physics Symposium (IRPS), 2013.
DOI : 10.1109/IRPS.2013.6532028
URL : https://hal.archives-ouvertes.fr/emse-01109124

A. Sarafianos, O. Gagliano, M. Lisart, V. Serradeil, J. Dutertre et al., Building the electrical model of the pulsed photoelectric laser stimulation of a PMOS transistor in 90nm technology, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2013.
DOI : 10.1109/IPFA.2013.6599120

N. Borrel, C. Champeix, E. Kussener, W. Rahajandraibe, M. Lisart et al., Characterization and simulation of a body biased structure in triple-well technology under pulsed photoelectric laser
URL : https://hal.archives-ouvertes.fr/emse-01099035

N. Borrel, C. Champeix, E. Kussener, W. Rahajandraibe, M. Lisart et al., Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation, 2015 IEEE International Reliability Physics Symposium, 2015.
DOI : 10.1109/IRPS.2015.7112799
URL : https://hal.archives-ouvertes.fr/emse-01230163

N. Borrel, C. Champeix, E. Kussener, W. Rahajandraibe, M. Lisart et al., Electrical model of a PMOS body biased structure in triple-well technology under pulsed photoelectric laser stimulation, 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2015.
DOI : 10.1109/IPFA.2015.7224351

P. Gray, P. J. Hurst, S. H. Lewis, and R. G. Meyer, Analysis and Design of Analog Integrated Circuits, 2001.

C. Roscian, A. Sarafianos, J. Dutertre, and A. Tria, Fault Model Analysis of Laser-Induced Faults in SRAM Memory Cells (a) Bit-reset (b) Bit-set, FDTC, p.2013