A. Glowacki, Systematic Characterization of Integrated Circuit Standard Components as Stimulated by Scanning Laser Beam, IEEE Transactions on Device and Materials Reliability, vol.7, issue.1, 2010.
DOI : 10.1109/TDMR.2007.900056

K. Haraguchi, Microscopic optical seam induced current measurements and their applications, Proc. of 10th IEEE IMTC, pp.693-699, 1994.

A. Sarafianos, Building the electrical model of the pulsed photoelectric laser stimulation of an NMOS transistor in 90nm technology, 2013 IEEE International Reliability Physics Symposium (IRPS), 2013.
DOI : 10.1109/IRPS.2013.6532028
URL : https://hal.archives-ouvertes.fr/emse-01130636

D. Liu, Trading speed for low power by choice of supply and threshold voltages, IEEE Journal of Solid-State Circuits, vol.28, issue.1, 1993.
DOI : 10.1109/4.179198

A. Keshavarzi, Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC's, Proceedings of the 1999 international symposium on Low power electronics and design , ISLPED '99, p.252, 1999.
DOI : 10.1145/313817.313937

P. Gray, Analysis and Design of Analog Integrated Circuits, 2001.

A. Sarafianos, Building the electrical model of the pulsed photoelectric laser stimulation of a PMOS transistor in 90nm technology, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2013.
DOI : 10.1109/IPFA.2013.6599120

N. Borrel, Characterization and simulation of a body biased structure in triple-well technology under pulsed photoelectric laser
URL : https://hal.archives-ouvertes.fr/emse-01099035