O. Mekni, Dominique Goeuriot, Sergio Sao-Joao, Christophe Meunier, G. Damamme, et al.. Grains Size Effect on Charge Trapping in Electron Irradiated Ceramics; Stability and Discharge Study Using a Special Arrangement in a Scanning Electron Microscope .
2016 IEEE INTERNATIONAL CONFERENCE ON DIELECTRICS (ICD),, Jul 2016, Montpellier, France.
⟨emse-01526938⟩