Conference Papers
Year : 2017
Hamideh Rostami : Connect in order to contact the contributor
https://hal-emse.ccsd.cnrs.fr/emse-01621977
Submitted on : Monday, October 23, 2017-9:56:46 PM
Last modification on : Tuesday, September 17, 2024-3:46:12 PM
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- HAL Id : emse-01621977 , version 1
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Hamideh Rostami, Jakey Blue, Claude Yugma. Equipment Health Diagnosis and Prognosis using a Wavelet-based Windowing Approach in Semiconductor Manufacturing. Advanced Process Control Conference, Oct 2017, Austin,TX, United States. ⟨emse-01621977⟩
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