Smart dynamic sampling for wafer at risk reduction in semiconductor manufacturing - Mines Saint-Étienne Access content directly
Conference Papers Year : 2014
No file

Dates and versions

emse-01792292 , version 1 (15-05-2018)

Identifiers

Cite

Sylvain Housseman, Stéphane Dauzère-Pérès, Gloria Rodriguez-Verjan, Jacques Pinaton. Smart dynamic sampling for wafer at risk reduction in semiconductor manufacturing. 2014 IEEE International Conference on Automation Science and Engineering (CASE), Aug 2014, Taipei, Taiwan. ⟨10.1109/CoASE.2014.6899414⟩. ⟨emse-01792292⟩
39 View
0 Download

Altmetric

Share

Gmail Facebook X LinkedIn More