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Laser testing of a double-access BBICS architecture with improved SEE detection capabilities

Abstract : The paper reports the experimental validation of a new Bulk Built-In Current Sensor (BBICS) designed and implemented in a 40nm CMOS technology. The double-access architecture provides improved SEE detection as confirmed by laser experiments.
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https://hal-emse.ccsd.cnrs.fr/emse-01855833
Contributor : Jean-Max Dutertre <>
Submitted on : Wednesday, August 8, 2018 - 3:56:16 PM
Last modification on : Wednesday, June 24, 2020 - 4:18:24 PM
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Clément Champeix, Jean-Max Dutertre, Vincent Pouget, Bruno Robisson, Mathieu Lisart, et al.. Laser testing of a double-access BBICS architecture with improved SEE detection capabilities. 2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS), Sep 2016, Bremen, Germany. ⟨10.1109/RADECS.2016.8093172⟩. ⟨emse-01855833⟩

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