Laser testing of a double-access BBICS architecture with improved SEE detection capabilities

Clément Champeix; Jean-Max Dutertre; Vincent Pouget; Bruno Robisson; Mathieu Lisart; Nicolas Borrel; Alexandre Sarafianos

doi:10.1109/RADECS.2016.8093172

Conference papers

Laser testing of a double-access BBICS architecture with improved SEE detection capabilities

Clément Champeix ¹ Jean-Max Dutertre ¹ Vincent Pouget ^{2, 3} Bruno Robisson ¹ Mathieu Lisart ⁴ Nicolas Borrel ⁵ Alexandre Sarafianos ⁶

1 SAS-ENSMSE - Département Systèmes et Architectures Sécurisés

2 IES - Institut d’Electronique et des Systèmes

3 RADIAC - Radiations et composants

IES - Institut d’Electronique et des Systèmes

4 ST-ROUSSET - STMicroelectronics [Rousset]

5 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

6 STMicroelectronics

Abstract : The paper reports the experimental validation of a new Bulk Built-In Current Sensor (BBICS) designed and implemented in a 40nm CMOS technology. The double-access architecture provides improved SEE detection as confirmed by laser experiments.

Keywords : Laser fault injection SEE detection Single-Event Effects Radiation-hardening by design Bulk Built-In Current Sensor

Document type :

Conference papers

Domain :

Engineering Sciences [physics] / Micro and nanotechnologies/Microelectronics

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Last modification on : Monday, July 5, 2021 - 3:44:04 PM
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Laser testing of a double-access BBICS architecture with improved SEE detection capabilities

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Laser testing of a double-access BBICS architecture with improved SEE detection capabilities

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