Laser testing of a double-access BBICS architecture with improved SEE detection capabilities
Abstract
The paper reports the experimental validation of a new Bulk Built-In Current Sensor (BBICS) designed and implemented in a 40nm CMOS technology. The double-access architecture provides improved SEE detection as confirmed by laser experiments.
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hal_CHA16_radecs_Laser testing of a double-access BBICS architecture with improved SEE detection capabilities_v03 - copie.pdf (1.85 Mo)
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