It is shown that high-energy X-ray diffraction allows a fast and accurate texture and microstructure analysis of crystals, which can help to set up optimal industrial procedures for materials manufacturing. This paper presents the experimental and theoretical aspects of quantitative texture analysis using high-energy synchrotron beams. Intensity corrections are less important in this approach than in classical laboratory methods; however, the most important correction, related to the Lorentz factor, can introduce relative fraction changes of up to about 40% compared to the uncorrected case. The resolution of the orientation density function also influences the results. For example, the usual 5° resolution leads to relative deviations of up to 30% in the fraction of some components. The method allowed detection of small changes taking place during the recovery and continuous recrystallization of a cold-rolled Al–TiB2 nanocomposite. Texture information was combined with the results of line profile analysis, evidencing the evolution of the average dislocation density and coherent domain size of the selected grain families. It was found that recovery, as described in terms of dislocation annihilation and coherent domain coarsening, takes place at similar rates in all components.