Grain boundary-mediated plasticity in aluminum films unraveled by a statistical approach combining nano-DIC and ACOM-TEM - Mines Saint-Étienne Access content directly
Journal Articles Acta Materialia Year : 2024

Grain boundary-mediated plasticity in aluminum films unraveled by a statistical approach combining nano-DIC and ACOM-TEM

Abstract

Nanomechanical on-chip testing is combined with nanoscale in situ digital image correlation and automated crystal orientation mapping in TEM to deliver novel statistically representative quantitative data about the deformation mechanisms in nanocrystalline aluminum films. The films are very ductile, with a rare stable multiple necking process with local strains reaching up to 0.45 and macroscopic elongation up to 0.17. The strain fields with resolution below 100 nm are related to the underlying microstructure and crystallographic orientation maps. This reveals nanoscopic shear bands forming preferentially along GB with high misorientations, tilted at +/− 45° with respect to loading direction. The analysis of these data prove that the strong strain delocalization process is promoted by GB migration and grain rotation, leading to large strain rate sensitivity. The distribution of misorientation angles between grains evolve during deformation. The GBs with misorientation between 20° and 40°, which are the GBs with highest energy, involve the largest strains.
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Dates and versions

emse-04617858 , version 1 (19-06-2024)

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Paul Baral, Ankush Kashiwar, Michaël Coulombier, Laurent Delannay, Khalid Hoummada, et al.. Grain boundary-mediated plasticity in aluminum films unraveled by a statistical approach combining nano-DIC and ACOM-TEM. Acta Materialia, 2024, 276, pp.120081. ⟨10.1016/j.actamat.2024.120081⟩. ⟨emse-04617858⟩
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