<?xml version="1.0" encoding="utf-8"?>
<TEI xmlns="http://www.tei-c.org/ns/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:hal="http://hal.archives-ouvertes.fr/" xmlns:gml="http://www.opengis.net/gml/3.3/" xmlns:gmlce="http://www.opengis.net/gml/3.3/ce" version="1.1" xsi:schemaLocation="http://www.tei-c.org/ns/1.0 http://api.archives-ouvertes.fr/documents/aofr-sword.xsd">
  <teiHeader>
    <fileDesc>
      <titleStmt>
        <title>HAL TEI export of emse-04832185</title>
      </titleStmt>
      <publicationStmt>
        <distributor>CCSD</distributor>
        <availability status="restricted">
          <licence target="https://creativecommons.org/publicdomain/zero/1.0/">CC0 1.0 - Universal</licence>
        </availability>
        <date when="2026-05-17T01:01:23+02:00"/>
      </publicationStmt>
      <sourceDesc>
        <p part="N">HAL API Platform</p>
      </sourceDesc>
    </fileDesc>
  </teiHeader>
  <text>
    <body>
      <listBibl>
        <biblFull>
          <titleStmt>
            <title xml:lang="en">Analysis of LED solder joints during combined power and thermal cycling</title>
            <author role="aut">
              <persName>
                <forename type="first">Khalil</forename>
                <surname>Maarouf</surname>
              </persName>
              <idno type="halauthorid">2554031-0</idno>
              <affiliation ref="#struct-553655"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Christine</forename>
                <surname>Roucoules</surname>
              </persName>
              <idno type="halauthorid">866368-0</idno>
              <affiliation ref="#struct-553655"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Helmut</forename>
                <surname>Klöcker</surname>
              </persName>
              <email type="md5">161232d54b233e3b70fc684a8b4500a4</email>
              <email type="domain">emse.fr</email>
              <idno type="idhal" notation="numeric">850117</idno>
              <idno type="halauthorid" notation="string">321266-850117</idno>
              <affiliation ref="#struct-209650"/>
              <affiliation ref="#struct-22126"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Sergio</forename>
                <surname>Sao Joao</surname>
              </persName>
              <email type="md5">d69ce258718fb45060040f076e524ed3</email>
              <email type="domain">emse.fr</email>
              <idno type="idhal" notation="numeric">874421</idno>
              <idno type="halauthorid" notation="string">480793-874421</idno>
              <affiliation ref="#struct-209650"/>
              <affiliation ref="#struct-22126"/>
            </author>
            <editor role="depositor">
              <persName>
                <forename>Fatima</forename>
                <surname>Lillouch</surname>
              </persName>
              <email type="md5">f99b654e4e353d7c2877cd53b8e48917</email>
              <email type="domain">emse.fr</email>
            </editor>
          </titleStmt>
          <editionStmt>
            <edition n="v1" type="current">
              <date type="whenSubmitted">2025-01-09 10:23:39</date>
              <date type="whenWritten">2024</date>
              <date type="whenModified">2026-02-07 05:29:58</date>
              <date type="whenReleased">2025-01-17 17:30:16</date>
              <date type="whenProduced">2024-09-11</date>
              <date type="whenEndEmbargoed">2025-05-01</date>
              <ref type="file" target="https://hal-emse.ccsd.cnrs.fr/emse-04832185v1/document">
                <date notBefore="2025-05-01"/>
              </ref>
              <ref type="file" subtype="author" n="1" target="https://hal-emse.ccsd.cnrs.fr/emse-04832185v1/file/KM_SSJ-ESTC2024.pdf" id="file-4876054-4239277">
                <date notBefore="2025-05-01"/>
              </ref>
            </edition>
            <respStmt>
              <resp>contributor</resp>
              <name key="179260">
                <persName>
                  <forename>Fatima</forename>
                  <surname>Lillouch</surname>
                </persName>
                <email type="md5">f99b654e4e353d7c2877cd53b8e48917</email>
                <email type="domain">emse.fr</email>
              </name>
            </respStmt>
          </editionStmt>
          <publicationStmt>
            <distributor>CCSD</distributor>
            <idno type="halId">emse-04832185</idno>
            <idno type="halUri">https://hal-emse.ccsd.cnrs.fr/emse-04832185</idno>
            <idno type="halBibtex">maarouf:emse-04832185</idno>
            <idno type="halRefHtml">&lt;i&gt;10th IEEE Electronics System-Integration Technology Conference (IEEE ESTC 2024)&lt;/i&gt;, Sep 2024, Berlin, Germany. &lt;a target="_blank" href="https://dx.doi.org/10.1109/ESTC60143.2024.10712113"&gt;&amp;#x27E8;10.1109/ESTC60143.2024.10712113&amp;#x27E9;&lt;/a&gt;</idno>
            <idno type="halRef">10th IEEE Electronics System-Integration Technology Conference (IEEE ESTC 2024), Sep 2024, Berlin, Germany. &amp;#x27E8;10.1109/ESTC60143.2024.10712113&amp;#x27E9;</idno>
            <availability status="restricted">
              <licence target="https://about.hal.science/hal-authorisation-v1/">HAL Authorization<ref corresp="#file-4876054-4239277"/></licence>
            </availability>
          </publicationStmt>
          <seriesStmt>
            <idno type="stamp" n="EMSE" corresp="INSTITUT-MINES-TELECOM">Ecole Nationale Supérieure des Mines de Saint-Etienne</idno>
            <idno type="stamp" n="CNRS">CNRS - Centre national de la recherche scientifique</idno>
            <idno type="stamp" n="INSTITUTS-TELECOM">composantes instituts telecom </idno>
            <idno type="stamp" n="INSTITUT-MINES-TELECOM">Institut Mines Telecom</idno>
          </seriesStmt>
          <notesStmt>
            <note type="audience" n="2">International</note>
            <note type="invited" n="0">No</note>
            <note type="popular" n="0">No</note>
            <note type="peer" n="1">Yes</note>
            <note type="proceedings" n="1">Yes</note>
          </notesStmt>
          <sourceDesc>
            <biblStruct>
              <analytic>
                <title xml:lang="en">Analysis of LED solder joints during combined power and thermal cycling</title>
                <author role="aut">
                  <persName>
                    <forename type="first">Khalil</forename>
                    <surname>Maarouf</surname>
                  </persName>
                  <idno type="halauthorid">2554031-0</idno>
                  <affiliation ref="#struct-553655"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Christine</forename>
                    <surname>Roucoules</surname>
                  </persName>
                  <idno type="halauthorid">866368-0</idno>
                  <affiliation ref="#struct-553655"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Helmut</forename>
                    <surname>Klöcker</surname>
                  </persName>
                  <email type="md5">161232d54b233e3b70fc684a8b4500a4</email>
                  <email type="domain">emse.fr</email>
                  <idno type="idhal" notation="numeric">850117</idno>
                  <idno type="halauthorid" notation="string">321266-850117</idno>
                  <affiliation ref="#struct-209650"/>
                  <affiliation ref="#struct-22126"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Sergio</forename>
                    <surname>Sao Joao</surname>
                  </persName>
                  <email type="md5">d69ce258718fb45060040f076e524ed3</email>
                  <email type="domain">emse.fr</email>
                  <idno type="idhal" notation="numeric">874421</idno>
                  <idno type="halauthorid" notation="string">480793-874421</idno>
                  <affiliation ref="#struct-209650"/>
                  <affiliation ref="#struct-22126"/>
                </author>
              </analytic>
              <monogr>
                <idno type="localRef">KM_SSJ_ ESTC2024</idno>
                <title level="m">2024 IEEE 10th Electronics System-Integration Technology Conference (ESTC)</title>
                <meeting>
                  <title>10th IEEE Electronics System-Integration Technology Conference (IEEE ESTC 2024)</title>
                  <date type="start">2024-09-11</date>
                  <date type="end">2024-09-13</date>
                  <settlement>Berlin</settlement>
                  <country key="DE">Germany</country>
                </meeting>
                <imprint>
                  <publisher>IEEE</publisher>
                  <date type="datePub">2024-10-15</date>
                </imprint>
              </monogr>
              <idno type="doi">10.1109/ESTC60143.2024.10712113</idno>
              <ref target="https://www.mines-stetienne.fr/lgf/" type="seeAlso"/>
              <ref type="publisher">https://ieeexplore.ieee.org/document/10712113</ref>
            </biblStruct>
          </sourceDesc>
          <profileDesc>
            <langUsage>
              <language ident="en">English</language>
            </langUsage>
            <textClass>
              <keywords scheme="author">
                <term xml:lang="en">Thermal fatigue</term>
                <term xml:lang="en">Power Thermal Cycling</term>
                <term xml:lang="en">High-power LED</term>
                <term xml:lang="en">Reliability</term>
              </keywords>
              <classCode scheme="halDomain" n="spi.mat">Engineering Sciences [physics]/Materials</classCode>
              <classCode scheme="halDomain" n="spi.nano">Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics</classCode>
              <classCode scheme="halTypology" n="COMM">Conference papers</classCode>
              <classCode scheme="halOldTypology" n="COMM">Conference papers</classCode>
              <classCode scheme="halTreeTypology" n="COMM">Conference papers</classCode>
            </textClass>
            <abstract xml:lang="en">
              <p>VLS's lighting products offer enhanced brightness along with intelligent features and sustainable solutions to decrease CO&lt;sub&gt;2&lt;/sub&gt; emissions. These new features ensure an optimal driving experience, prioritizing safety and comfort for both drivers and pedestrians. The reliability of the electronic systems is confirmed through standard tests like power cycling or thermal cycling. VLS is also working on simulation solutions to numerically validate the design and reliability of these electronic systems. A cause of failure in thermal shock tests is the thermal fatigue of solder joints, resulting from repeated thermal stresses on the assembly caused by the mismatch in Coefficient of Thermal Expansion (CTE) between the LED and the substrate. The primary focus has been on developing a predictive simulation method to assess the reliability of LED assemblies under combined power and thermal cycling. In this study, we delineate the steps involved in validating the simulation of combined power and thermal cycles in LED systems. Using thermomechanical simulations, we examine the cumulative damage to solder joints caused by both thermal cycling and power cycling. In a combined power thermal cycling test, the electronic system experiences a combination of high cycle fatigue (HCL) due to power cycling (several million cycles) and low fatigue damage (LCF) from thermal cycles. In order to consider the combined fatigue damages due to those two loadings a new approach was considered. Firstly, we will begin by analyzing the spatial and temporal evolution of temperature within the assembly through transient thermal simulations. Subsequently, based on these temperature variations, we conduct a decomposition of damage analysis between HCF and LFC models, examining them independently. The Low cycle fatigue model was validated by comparing the fatigue life prediction with results from thermal cycle testing. Following this, we assessed the cumulative damage of HCL and LCF by comparing it with outcomes from combined power thermal cycle testing. Finally, we establish a correlation between the experimental number of cycles at failure and the cracked surface observed with dye penetrant to evaluate the accuracy of our model's assumptions. This new method demonstrates promising predictive capability for combined power thermal cycle testing results, while also enhancing our understanding of design parameters that accelerate failures.</p>
            </abstract>
            <particDesc>
              <org type="consortium">Valeo Lighting Systems</org>
            </particDesc>
          </profileDesc>
        </biblFull>
      </listBibl>
    </body>
    <back>
      <listOrg type="structures">
        <org type="laboratory" xml:id="struct-553655" status="VALID">
          <orgName>Valeo Lighting Systems</orgName>
          <orgName type="acronym">VLS</orgName>
          <desc>
            <address>
              <addrLine>34 Rue Saint-André, 93000 Bobigny</addrLine>
              <country key="FR"/>
            </address>
          </desc>
          <listRelation>
            <relation active="#struct-552452" type="direct"/>
          </listRelation>
        </org>
        <org type="laboratory" xml:id="struct-209650" status="VALID">
          <idno type="RNSR">201320571H</idno>
          <idno type="ROR">01prxdf57</idno>
          <orgName>Laboratoire Georges Friedel</orgName>
          <orgName type="acronym">LGF-ENSMSE</orgName>
          <desc>
            <address>
              <addrLine>158, cours Fauriel F-42023 Saint-Étienne cedex 2</addrLine>
              <country key="FR"/>
            </address>
          </desc>
          <listRelation>
            <relation active="#struct-29212" type="direct"/>
            <relation active="#struct-302102" type="indirect"/>
            <relation active="#struct-301088" type="direct"/>
            <relation name="UMR5307" active="#struct-441569" type="direct"/>
          </listRelation>
        </org>
        <org type="laboratory" xml:id="struct-22126" status="VALID">
          <orgName>Centre Science des Matériaux et des Structures</orgName>
          <orgName type="acronym">SMS-ENSMSE</orgName>
          <desc>
            <address>
              <addrLine>158 cours Fauriel 42023 SAINT-ETIENNE Cedex 02</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.emse.fr/spip/-SMS-.html</ref>
          </desc>
          <listRelation>
            <relation active="#struct-29212" type="direct"/>
            <relation active="#struct-302102" type="indirect"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-552452" status="VALID">
          <orgName>VALEO</orgName>
          <desc>
            <address>
              <addrLine>43, Rue Bayen, 75017 Paris</addrLine>
              <country key="FR"/>
            </address>
          </desc>
        </org>
        <org type="regrouplaboratory" xml:id="struct-29212" status="VALID">
          <orgName>École des Mines de Saint-Étienne</orgName>
          <orgName type="acronym">Mines Saint-Étienne MSE</orgName>
          <desc>
            <address>
              <addrLine>158, Cours Fauriel - 42023 Saint Étienne cedex 2</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.mines-stetienne.fr/</ref>
          </desc>
          <listRelation>
            <relation active="#struct-302102" type="direct"/>
          </listRelation>
        </org>
        <org type="regroupinstitution" xml:id="struct-302102" status="VALID">
          <idno type="IdRef">192427156</idno>
          <idno type="ISNI">000000012202567X</idno>
          <idno type="ROR">https://ror.org/025vp2923</idno>
          <idno type="Wikidata">Q27962533</idno>
          <orgName>Institut Mines-Télécom [Paris]</orgName>
          <orgName type="acronym">IMT</orgName>
          <date type="start">2012-03-01</date>
          <desc>
            <address>
              <addrLine>19 Place Marguerite Perey, 91120 Palaiseau</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">https://www.imt.fr/</ref>
          </desc>
        </org>
        <org type="regroupinstitution" xml:id="struct-301088" status="VALID">
          <idno type="ROR">https://ror.org/01rk35k63</idno>
          <orgName>Université de Lyon</orgName>
          <desc>
            <address>
              <addrLine>92 rue Pasteur - CS 30122, 69361 Lyon Cedex 07</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">https://www.universite-lyon.fr/</ref>
          </desc>
        </org>
        <org type="regroupinstitution" xml:id="struct-441569" status="VALID">
          <idno type="IdRef">02636817X</idno>
          <idno type="ISNI">0000000122597504</idno>
          <idno type="ROR">https://ror.org/02feahw73</idno>
          <orgName>Centre National de la Recherche Scientifique</orgName>
          <orgName type="acronym">CNRS</orgName>
          <date type="start">1939-10-19</date>
          <desc>
            <address>
              <country key="FR"/>
            </address>
            <ref type="url">https://www.cnrs.fr/</ref>
          </desc>
        </org>
      </listOrg>
    </back>
  </text>
</TEI>