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Journal Articles Journal of Applied Crystallography Year : 2008

Rotation axis analysis of deformed crystals by X-rays and electrons

Abstract

X-ray and electron backscatter diffraction (EBSD) have been applied to investigate misorientation distributions in copper single crystals plastically deformed in single and multiple slip. The misorientation distributions are represented by 'rocking curves' about specific rotation axes. Very good agreement for the rocking curves established by the two methods was obtained, despite the large difference between their resolution depths. Following this agreement, a new rotation axis imaging scheme, based on the EBSD data, is proposed in order to visualize the crystallite blocks and characterize the nature of their dislocation boundaries.

Dates and versions

emse-00475670 , version 1 (22-04-2010)

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Cite

Andras Borbély, Claire Maurice, Julian H. Driver. Rotation axis analysis of deformed crystals by X-rays and electrons. Journal of Applied Crystallography, 2008, 41 (4), pp.747-753. ⟨10.1107/S0021889808015768⟩. ⟨emse-00475670⟩
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