Robustness of circuits under delay-induced faults : test of AES with the PAFI tool

Abstract : Security of cryptographic circuits is a major concern. Fault attacks are a mean to obtain critical information with the use of physical disturbance and cryptanalysis. We propose a methodology and a tool to analyse the robustness of circuit under faults induced by a delay. We tested a circuit implementing AES and showed that delay faults can permit to perform known fault attacks.
Liste complète des métadonnées

https://hal-emse.ccsd.cnrs.fr/emse-00504707
Contributor : Laurent Freund <>
Submitted on : Wednesday, July 21, 2010 - 10:57:56 AM
Last modification on : Tuesday, October 23, 2018 - 2:36:05 PM

Identifiers

Citation

Olivier Faurax, Laurent Freund, Assia Tria, Traian Muntean, Frédéric Bancel. Robustness of circuits under delay-induced faults : test of AES with the PAFI tool. 13th IEEE International On-Line Testing Symposium IOLTS 2007, Jul 2008, Heraklion, France. pp.185-186, ⟨10.1109/IOLTS.2007.57⟩. ⟨emse-00504707⟩

Share

Metrics

Record views

111