Robustness of circuits under delay-induced faults : test of AES with the PAFI tool - Mines Saint-Étienne Access content directly
Conference Papers Year : 2008

Robustness of circuits under delay-induced faults : test of AES with the PAFI tool

Abstract

Security of cryptographic circuits is a major concern. Fault attacks are a mean to obtain critical information with the use of physical disturbance and cryptanalysis. We propose a methodology and a tool to analyse the robustness of circuit under faults induced by a delay. We tested a circuit implementing AES and showed that delay faults can permit to perform known fault attacks.

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emse-00504707 , version 1 (21-07-2010)

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Olivier Faurax, Laurent Freund, Assia Tria, Traian Muntean, Frédéric Bancel. Robustness of circuits under delay-induced faults : test of AES with the PAFI tool. 13th IEEE International On-Line Testing Symposium IOLTS 2007, Jul 2008, Heraklion, France. pp.185-186, ⟨10.1109/IOLTS.2007.57⟩. ⟨emse-00504707⟩
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