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Mechanical Issues Induced by Electrical Wafer Sort: Correlations from actual tests, Nanoindentation and 3D Dynamic Modeling

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https://hal-emse.ccsd.cnrs.fr/emse-00533813
Contributor : Karim Inal <>
Submitted on : Monday, November 8, 2010 - 1:13:03 PM
Last modification on : Wednesday, June 24, 2020 - 4:18:19 PM

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Romuald Roucou, Vincent Fiori, Karim Inal, Hervé Jaouen. Mechanical Issues Induced by Electrical Wafer Sort: Correlations from actual tests, Nanoindentation and 3D Dynamic Modeling. Electronics System Integration Technology Conference ESTC 2010, Sep 2010, Berlin, Germany. pp.P0027, ⟨10.1109/ESTC.2010.5642863⟩. ⟨emse-00533813⟩

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