Mechanical Issues Induced by Electrical Wafer Sort: Correlations from actual tests, Nanoindentation and 3D Dynamic Modeling - Mines Saint-Étienne Access content directly
Conference Papers Year : 2010

Mechanical Issues Induced by Electrical Wafer Sort: Correlations from actual tests, Nanoindentation and 3D Dynamic Modeling

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emse-00533813 , version 1 (08-11-2010)

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Romuald Roucou, Vincent Fiori, Karim Inal, Hervé Jaouen. Mechanical Issues Induced by Electrical Wafer Sort: Correlations from actual tests, Nanoindentation and 3D Dynamic Modeling. Electronics System Integration Technology Conference ESTC 2010, Sep 2010, Berlin, Germany. pp.P0027, ⟨10.1109/ESTC.2010.5642863⟩. ⟨emse-00533813⟩
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