Mechanical Issues Induced by Electrical Wafer Sort: Correlations from actual tests, Nanoindentation and 3D Dynamic Modeling

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https://hal-emse.ccsd.cnrs.fr/emse-00533813
Contributeur : Karim Inal <>
Soumis le : lundi 8 novembre 2010 - 13:13:03
Dernière modification le : mercredi 29 novembre 2017 - 10:06:53

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Romuald Roucou, Vincent Fiori, Karim Inal, Hervé Jaouen. Mechanical Issues Induced by Electrical Wafer Sort: Correlations from actual tests, Nanoindentation and 3D Dynamic Modeling. Electronics System Integration Technology Conference ESTC 2010, Sep 2010, Berlin, Germany. pp.P0027, 2010, 〈10.1109/ESTC.2010.5642863〉. 〈emse-00533813〉

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