Review of fault injection mechanisms and consequences on countermeasures design

Jean-Max Dutertre 1, * Jacques Jean-Alain Fournier 1, 2 Amir Pasha Mirbaha 1 David Naccache 3 Jean-Baptiste Rigaud 1 Bruno Robisson 1, 2 Assia Tria 1, 2
* Auteur correspondant
1 SAS-ENSMSE - Département Systèmes et Architectures Sécurisés
2 CMP-ENSMSE - Centre Microélectronique de Provence - Site Georges Charpak (CMP-GC)
3 LIENS - Laboratoire d'informatique de l'école normale supérieure
Abstract : The secret keys handled by cryptographic devices can be extracted using fault attacks associated with cryptanalysis techniques. These faults can be induced by different means such as laser exposure, voltage or clock glitches, electromagnetic perturbation, etc. This paper provides a detailed insight into the physics and mechanisms involved in several fault injection processes. The paper also highlights the difficulty to design countermeasures while even hardware duplication, usually considered as secure, has proved to show flaws against low cost fault injection means.
Keywords : Fault attack hardware duplication laser fault injection timing constraints violation
Type de document :
Communication dans un congrès
Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2011 6th International Conference on, Apr 2011, athens, Greece. pp.1 - 6, 2011, 〈10.1109/DTIS.2011.5941421〉
Liste complète des métadonnées
https://hal-emse.ccsd.cnrs.fr/emse-00623133
Contributeur : Jean-Max Dutertre <>
Soumis le : mardi 13 septembre 2011 - 16:01:12
Dernière modification le : lundi 7 janvier 2019 - 14:12:04

Identifiants

Collections

ENS-PARIS | SAS-ENSMSE | EMSE | CMP-ENSMSE | PSL

Citation

Jean-Max Dutertre, Jacques Jean-Alain Fournier, Amir Pasha Mirbaha, David Naccache, Jean-Baptiste Rigaud, et al.. Review of fault injection mechanisms and consequences on countermeasures design. Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2011 6th International Conference on, Apr 2011, athens, Greece. pp.1 - 6, 2011, 〈10.1109/DTIS.2011.5941421〉. 〈emse-00623133〉

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

420

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD