X-ray line profiles analysis of plastically deformed metals

Abstract : The theoretical basis of X-ray line profile analysis and its application to microstructural characterization of plastically deformed metallic alloys is presented. The microstructure is described in terms of coherent domain size, planar fault density, dislocation density and a dislocation arrangement parameter. Two evaluation methods are introduced: the momentum method and the extended Convolutional Multiple Whole Profile fit procedure. Their use is exemplified on plastically deformed single crystals, single grains residing in the bulk of a polycrystal and family of grains making up texture components. The selected examples show the potential of X-ray line profile analysis applied to diffraction patterns recorded with laboratory or synchrotron sources.
Type de document :
Article dans une revue
Comptes Rendus Physique, Elsevier Masson, 2012, 13 (3), pp.293-306. 〈10.1016/j.crhy.2011.12.004〉
Domaine :
Liste complète des métadonnées

https://hal-emse.ccsd.cnrs.fr/emse-00828872
Contributeur : Anna Fraczkiewicz <>
Soumis le : vendredi 31 mai 2013 - 16:40:00
Dernière modification le : mercredi 29 novembre 2017 - 10:08:19

Identifiants

Collections

Citation

András Borbély, T. Ungar. X-ray line profiles analysis of plastically deformed metals. Comptes Rendus Physique, Elsevier Masson, 2012, 13 (3), pp.293-306. 〈10.1016/j.crhy.2011.12.004〉. 〈emse-00828872〉

Partager

Métriques

Consultations de la notice

56