X-ray line profiles analysis of plastically deformed metals - Mines Saint-Étienne
Article Dans Une Revue Comptes Rendus. Physique Année : 2012

X-ray line profiles analysis of plastically deformed metals

Résumé

The theoretical basis of X-ray line profile analysis and its application to microstructural characterization of plastically deformed metallic alloys is presented. The microstructure is described in terms of coherent domain size, planar fault density, dislocation density and a dislocation arrangement parameter. Two evaluation methods are introduced: the momentum method and the extended Convolutional Multiple Whole Profile fit procedure. Their use is exemplified on plastically deformed single crystals, single grains residing in the bulk of a polycrystal and family of grains making up texture components. The selected examples show the potential of X-ray line profile analysis applied to diffraction patterns recorded with laboratory or synchrotron sources.

Dates et versions

emse-00828872 , version 1 (31-05-2013)

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Citer

András Borbély, T. Ungar. X-ray line profiles analysis of plastically deformed metals. Comptes Rendus. Physique, 2012, 13 (3), pp.293-306. ⟨10.1016/j.crhy.2011.12.004⟩. ⟨emse-00828872⟩
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