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Conference Papers Year : 2013

Semiconductor Yield Loss' Causes Identification : A Data Mining Approach

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emse-00856619 , version 1 (02-09-2013)

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  • HAL Id : emse-00856619 , version 1

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Hasna Barkia, Xavier Boucher, Rodolphe Le Riche, Marie-Agnès Girard, Philippe Beaune. Semiconductor Yield Loss' Causes Identification : A Data Mining Approach. 2013 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM2013), Dec 2013, Bangkok, Thailand. pp.article no. IEEM13-P-0503. ⟨emse-00856619⟩
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