Semiconductor Yield Loss' Causes Identification : A Data Mining Approach

Hasna Barkia 1, 2, 3 Xavier Boucher 1, 3 Rodolphe Le Riche 4 Marie-Agnès Girard 1, 3 Philippe Beaune 5
4 DEMO
LIMOS - Laboratoire d'Informatique, de Modélisation et d'optimisation des Systèmes, DEMO-ENSMSE - Département Décision en Entreprise : Modélisation, Optimisation, LCG-ENSMSE - UMR 5146 - Laboratoire Claude Goux
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Conference papers
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https://hal-emse.ccsd.cnrs.fr/emse-00856619
Contributor : Florent Breuil <>
Submitted on : Monday, September 2, 2013 - 9:26:42 AM
Last modification on : Tuesday, April 9, 2019 - 5:00:13 PM

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  • HAL Id : emse-00856619, version 1

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Hasna Barkia, Xavier Boucher, Rodolphe Le Riche, Marie-Agnès Girard, Philippe Beaune. Semiconductor Yield Loss' Causes Identification : A Data Mining Approach. 2013 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM2013), Dec 2013, Bangkok, Thailand. pp.article no. IEEM13-P-0503. ⟨emse-00856619⟩

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