X-ray diffraction microscopy: emerging imaging techniques for nondestructive analysis of crystalline materials from the millimetre down to the nanometre scale - Mines Saint-Étienne Access content directly
Journal Articles Journal of Applied Crystallography Year : 2013

X-ray diffraction microscopy: emerging imaging techniques for nondestructive analysis of crystalline materials from the millimetre down to the nanometre scale

Keywords

TOMOGRAPHY

Domains

Materials

Géraldine Fournier-Moulin  : Connect in order to contact the contributor

https://hal-emse.ccsd.cnrs.fr/emse-01067614

Submitted on : Tuesday, September 23, 2014-4:45:44 PM

Last modification on : Friday, March 24, 2023-2:52:59 PM

Consult the full text

Dates and versions

emse-01067614 , version 1 (23-09-2014)

Identifiers

Cite

András Borbély, Anke R. Kaysser-Pyzalla. X-ray diffraction microscopy: emerging imaging techniques for nondestructive analysis of crystalline materials from the millimetre down to the nanometre scale. Journal of Applied Crystallography, 2013, 46, pp.295-296. ⟨10.1107/S0021889813004160⟩. ⟨emse-01067614⟩

Export

BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite

Collections

EMSE INSTITUT-TELECOM CNRS
37 View
0 Download

Altmetric

Share

Gmail Facebook X LinkedIn More