Recipe-Independent Health Indicator for Tool Predictive Maintenance and Fault Diagnosis - Mines Saint-Étienne Access content directly
Journal Articles IEEE Transactions on Semiconductor Manufacturing Year : 2009

Recipe-Independent Health Indicator for Tool Predictive Maintenance and Fault Diagnosis

Argon Chen
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Abstract

Advanced sensor and information technologies have made real-time tool data readily accessible to tool and process engineers. A significant number of tool parameters (SVID’s) is collected during wafer processing and a large amount of tool data is acquired and available for fault detection and classification (FDC). Many IC makers have substantially improved the process capabilities by implementing FDC. With the real-time tool data, one can also evaluate the overall tool condition so that tool maintenance can be more effectively scheduled and the post-maintenance tool condition can be more easily qualified. However, due to the frequent change of recipes and the diversity of operations, the overall tool health is very difficult to evaluate. In this paper, we propose a recipe-independent health indicator based on the generalized moving variance. It is shown that the indicator faithfully reveals the tool condition regardless of recipe/operation changes. With the tool health indicator, possible tool faults can be identified and proper maintenance measures can be scheduled accordingly. The proposed indicator will be demonstrated and validated through the case studies of a PECVD and a PVD tool from a local fab.
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Dates and versions

emse-01098366 , version 1 (24-12-2014)

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  • HAL Id : emse-01098366 , version 1

Cite

Argon Chen, Jakey Blue. Recipe-Independent Health Indicator for Tool Predictive Maintenance and Fault Diagnosis. IEEE Transactions on Semiconductor Manufacturing, 2009, 22 (4), pp.522-535. ⟨emse-01098366⟩
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