Comparison of bulk built-in current sensors in terms of transient-fault detection sensitivity

Abstract : Several architectures of Bulk Built-In Current Sensors (BBICS) were recently proposed to monitor transient faults induced on integrated circuits by radiation or malicious sources. This work compares for the first time all existing static BBICS architectures in terms of their sensitivities to detect transient faults. In addition, we propose a new static BBICS that presents better results of transient-fault detection sensitivity than previous sensor architectures.
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Communication dans un congrès
CMOS variability (VARI), Sep 2014, Palma de Mallorca, Spain. 〈10.1109/VARI.2014.6957089〉
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https://hal-emse.ccsd.cnrs.fr/emse-01099015
Contributeur : Jean-Max Dutertre <>
Soumis le : mardi 30 décembre 2014 - 16:12:07
Dernière modification le : mardi 23 octobre 2018 - 14:36:04

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Rodrigo Possamai Bastos, Jean-Max Dutertre, Frank Sill Torres. Comparison of bulk built-in current sensors in terms of transient-fault detection sensitivity. CMOS variability (VARI), Sep 2014, Palma de Mallorca, Spain. 〈10.1109/VARI.2014.6957089〉. 〈emse-01099015〉

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