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Comparison of bulk built-in current sensors in terms of transient-fault detection sensitivity

Rodrigo Possamai Bastos 1 Jean-Max Dutertre 2 Frank Sill Torres 3
1 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés
2 SAS-ENSMSE - Département Systèmes et Architectures Sécurisés
3 DEE - Federal University of Minas Gerais
DELT - Department of Electronic Engineering [UFMG]
Abstract : Several architectures of Bulk Built-In Current Sensors (BBICS) were recently proposed to monitor transient faults induced on integrated circuits by radiation or malicious sources. This work compares for the first time all existing static BBICS architectures in terms of their sensitivities to detect transient faults. In addition, we propose a new static BBICS that presents better results of transient-fault detection sensitivity than previous sensor architectures.
Keywords : Bulk Built-In Current Sensors
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Conference papers
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https://hal-emse.ccsd.cnrs.fr/emse-01099015
Contributor : Jean-Max Dutertre <>
Submitted on : Tuesday, December 30, 2014 - 4:12:07 PM
Last modification on : Friday, December 11, 2020 - 8:28:05 AM

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EMSE | CNRS | TIMA | SAS-ENSMSE | INSTITUT-TELECOM | UGA

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Rodrigo Possamai Bastos, Jean-Max Dutertre, Frank Sill Torres. Comparison of bulk built-in current sensors in terms of transient-fault detection sensitivity. CMOS variability (VARI), Sep 2014, Palma de Mallorca, Spain. ⟨10.1109/VARI.2014.6957089⟩. ⟨emse-01099015⟩

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