Comparison of bulk built-in current sensors in terms of transient-fault detection sensitivity

Rodrigo Possamai Bastos 1 Jean-Max Dutertre 2 Frank Sill Torres 3
1 TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture
2 SAS-ENSMSE - Département Systèmes et Architectures Sécurisés
3 DEE - Federal University of Minas Gerais
DELT - Department of Electronic Engineering [UFMG]
Abstract : Several architectures of Bulk Built-In Current Sensors (BBICS) were recently proposed to monitor transient faults induced on integrated circuits by radiation or malicious sources. This work compares for the first time all existing static BBICS architectures in terms of their sensitivities to detect transient faults. In addition, we propose a new static BBICS that presents better results of transient-fault detection sensitivity than previous sensor architectures.
Keywords : Bulk Built-In Current Sensors
Type de document :
Communication dans un congrès
CMOS variability (VARI), Sep 2014, Palma de Mallorca, Spain. 〈10.1109/VARI.2014.6957089〉
Liste complète des métadonnées
https://hal-emse.ccsd.cnrs.fr/emse-01099015
Contributeur : Jean-Max Dutertre <>
Soumis le : mardi 30 décembre 2014 - 16:12:07
Dernière modification le : mercredi 16 mai 2018 - 18:30:04

Identifiants

Collections

EMSE | TIMA | SAS-ENSMSE | UGA

Citation

Rodrigo Possamai Bastos, Jean-Max Dutertre, Frank Sill Torres. Comparison of bulk built-in current sensors in terms of transient-fault detection sensitivity. CMOS variability (VARI), Sep 2014, Palma de Mallorca, Spain. 〈10.1109/VARI.2014.6957089〉. 〈emse-01099015〉

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

241

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD