Characterization and simulation of a body biased structure in triple-well technology under pulsed photoelectric laser stimulation

Nicolas Borrel 1, 2 Clément Champeix 3, 1 Mathieu Lisart 1 Alexandre Sarafianos 1 Edith Kussener 2 Wenceslas Rahajandraibe 2 Jean-Max Dutertre 3
1 ST-TOURS - STMicroelectronics [Tours]
2 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
3 SAS-ENSMSE - Département Systèmes et Architectures Sécurisés
Abstract : This study is driven by the need to optimize failure analysis methodologies based on laser/silicon interactions inside an integrated circuit using a triple-well process. It is therefore mandatory to understand the behavior of elementary devices to laser illumination, in order to model and predict the behavior of more complex circuits. This paper presents measurements of the photoelectric currents induced by a pulsed laser on a triple-well Psubstrate/DeepNwell/Pwell structure dedicated to low power body biasing techniques. It reveals possible bipolar transistor activation at high laser power. This activation threshold revealed its dependence on laser power and wells biasing. Based on the measurements made during our experiments, an electrical model is proposed that makes it possible to simulate the effects induced by photoelectric laser stimulation.
Type de document :
Communication dans un congrès
International Symposium for Testing and Failure Analysis (ISTFA), Nov 2014, Houston, United States
Liste complète des métadonnées
https://hal-emse.ccsd.cnrs.fr/emse-01099035
Contributeur : Jean-Max Dutertre <>
Soumis le : mardi 30 décembre 2014 - 17:34:20
Dernière modification le : lundi 7 janvier 2019 - 14:12:02

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  • HAL Id : emse-01099035, version 1

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EMSE | UNIV-TLN | UNIV-AMU | SAS-ENSMSE | INSTITUT-TELECOM | IM2NP

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Nicolas Borrel, Clément Champeix, Mathieu Lisart, Alexandre Sarafianos, Edith Kussener, et al.. Characterization and simulation of a body biased structure in triple-well technology under pulsed photoelectric laser stimulation. International Symposium for Testing and Failure Analysis (ISTFA), Nov 2014, Houston, United States. 〈emse-01099035〉

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