Analysis of a fault injection mechanism related to voltage glitches using an on-chip voltmeter - Mines Saint-Étienne
Conference Papers Year : 2014

Analysis of a fault injection mechanism related to voltage glitches using an on-chip voltmeter

Abstract

Analysis of a fault injection mechanism related to voltage glitches using an on-chip voltmeter

Domains

Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics
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Jean-Max Dutertre  : Connect in order to contact the contributor

https://hal-emse.ccsd.cnrs.fr/emse-01099039

Submitted on : Friday, January 9, 2015-3:00:24 PM

Last modification on : Tuesday, September 17, 2024-3:45:46 PM

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emse-01099039 , version 1 (09-01-2015)

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  • HAL Id : emse-01099039 , version 1

Cite

Loïc Zussa, Jean-Max Dutertre, Jessy Clédière, Bruno Robisson. Analysis of a fault injection mechanism related to voltage glitches using an on-chip voltmeter. TRUDEVICE Workshop (colocated with ETS 2014), May 2014, Paderborn, Germany. ⟨emse-01099039⟩

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