Improving an SEU Hard Design using a Pulsed Laser

Jean-Max Dutertre 1 Fernand-Michel Roche 2 Patrice Fouillat 3 Dean Lewis 3
1 SAS-ENSMSE - Département Systèmes et Architectures Sécurisés
2 LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
3 IMS Laboratory- Bordeaux University
IMS - Laboratoire de l'intégration, du matériau au système
Abstract : The purpose of this work is to present one investigation utilizing a pulsed laser as a tool to improve the Single Event Upset tolerance of a memory cell. These results coming with a previous ion testing evaluation of the circuit allow an optimization of the design. The laser results permit a more detailed analysis of the phenomenon leading to the upset and a precise localization of the most sensitive areas. As a result the behavior verification of the design combined with the use of robust elementary blocks strengthens the hardening capabilities of the cell.
Keywords : Single event effect Single event upset Single event transient Radiation hardening
Type de document :
Communication dans un congrès
Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on, Sep 2001, Grenoble, France. 〈10.1109/RADECS.2001.1159287〉
Liste complète des métadonnées

Littérature citée [16 références]  Voir  Masquer  Télécharger
https://hal-emse.ccsd.cnrs.fr/emse-01130950
Contributeur : Jean-Max Dutertre <>
Soumis le : jeudi 12 mars 2015 - 15:48:55
Dernière modification le : mercredi 20 juin 2018 - 09:26:59
Document(s) archivé(s) le : lundi 17 avril 2017 - 11:09:45

Fichier

HAL_radecs2001_Improving_an_SE...
Fichiers produits par l'(les) auteur(s)

Identifiants

Collections

EMSE | IMS-BORDEAUX | IMS-BORDEAUX-FUSION | SAS-ENSMSE | LIRMM | MIPS | UNIV-MONTPELLIER

Citation

Jean-Max Dutertre, Fernand-Michel Roche, Patrice Fouillat, Dean Lewis. Improving an SEU Hard Design using a Pulsed Laser. Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on, Sep 2001, Grenoble, France. 〈10.1109/RADECS.2001.1159287〉. 〈emse-01130950〉

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

327

Téléchargements de fichiers

269

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD