Improving an SEU Hard Design using a Pulsed Laser

Jean-Max Dutertre 1 Fernand-Michel Roche 2 Patrice Fouillat 3 Dean Lewis 3
1 SAS-ENSMSE - Département Systèmes et Architectures Sécurisés
2 LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
3 IMS Laboratory- Bordeaux University
IMS - Laboratoire de l'intégration, du matériau au système
Abstract : The purpose of this work is to present one investigation utilizing a pulsed laser as a tool to improve the Single Event Upset tolerance of a memory cell. These results coming with a previous ion testing evaluation of the circuit allow an optimization of the design. The laser results permit a more detailed analysis of the phenomenon leading to the upset and a precise localization of the most sensitive areas. As a result the behavior verification of the design combined with the use of robust elementary blocks strengthens the hardening capabilities of the cell.
Keywords : Single event effect Single event upset Single event transient Radiation hardening
Document type :
Conference papers
Complete list of metadatas

Cited literature [16 references]  Display  Hide  Download
https://hal-emse.ccsd.cnrs.fr/emse-01130950
Contributor : Jean-Max Dutertre <>
Submitted on : Thursday, March 12, 2015 - 3:48:55 PM
Last modification on : Thursday, October 17, 2019 - 12:33:43 PM
Long-term archiving on: Monday, April 17, 2017 - 11:09:45 AM

File

HAL_radecs2001_Improving_an_SE...
Files produced by the author(s)

Identifiers

Collections

EMSE | INSTITUT-TELECOM | CNRS | IMS-BORDEAUX | IMS-BORDEAUX-FUSION | SAS-ENSMSE | LIRMM | MIPS | UNIV-MONTPELLIER

Citation

Jean-Max Dutertre, Fernand-Michel Roche, Patrice Fouillat, Dean Lewis. Improving an SEU Hard Design using a Pulsed Laser. Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on, Sep 2001, Grenoble, France. ⟨10.1109/RADECS.2001.1159287⟩. ⟨emse-01130950⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

488

Files downloads

734

Contact

Informations

CCSD