Electrical model of an Inverter body biased structure in triple well technology under pulsed photoelectric laser stimulation

Nicolas Borrel 1, 2 Clément Champeix 3, 1 Edith Kussener 2 Wenceslas Rahajandraibe 2 Mathieu Lisart 1 Jean-Max Dutertre 3 Alexandre Sarafianos 1
1 ST-CROLLES - STMicroelectronics [Crolles]
2 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
3 SAS-ENSMSE - Département Systèmes et Architectures Sécurisés
Abstract : This study is driven by the need to optimize reliability and failure analysis methodologies based on laser/silicon interactions with an integrated circuit using a triple-well process. Nowadays, single event effect (SEE) evaluations due to radiation impacts are critical in fault tolerance and security field. The prediction of a SEE occurring on electronic devices is proposed by the determination and modeling of the phenomena under pulsed laser stimulation. This paper presents measurements of the photoelectric currents induced by a pulsed-laser on an inverter in a triple-well Psubstrate/DeepNwell/Pwell structure dedicated to low power body biasing techniques. It reveals the possible activation change of the parasitic bipolar transistors. Based on these experimental mea- surements, an electrical model is proposed that makes it possible to simulate the effects induced by photoelectric laser stimulation. Therefore this electrical model could be used as a tool for characterizing more complex CMOS circuits under photoelectrical laser stimulation.
Keywords : Photoelectric laser stimulation Single Event Effect
Type de document :
Article dans une revue
Microelectronics Reliability, Elsevier, 2015, 55 (9-10), pp.1592-1599. 〈10.1016/j.microrel.2015.06.144〉
Liste complète des métadonnées
https://hal-emse.ccsd.cnrs.fr/emse-01227386
Contributeur : Jean-Max Dutertre <>
Soumis le : mercredi 8 août 2018 - 15:32:21
Dernière modification le : mardi 23 octobre 2018 - 14:36:05

Fichier

hal_ESREF_2015_Electrical_mode...
Fichiers produits par l'(les) auteur(s)

Identifiants

Collections

EMSE | UNIV-TLN | UNIV-AMU | CMP-ENSMSE | SAS-ENSMSE | IM2NP

Citation

Nicolas Borrel, Clément Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, et al.. Electrical model of an Inverter body biased structure in triple well technology under pulsed photoelectric laser stimulation. Microelectronics Reliability, Elsevier, 2015, 55 (9-10), pp.1592-1599. 〈10.1016/j.microrel.2015.06.144〉. 〈emse-01227386〉

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

183

Téléchargements de fichiers

4

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD