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Conference papers
Management of crisis situations in a large unified AMHS of a semiconductor manufacturing facility: IE: Industrial engineering
Moulaye Aidara Ndiaye
1, 2, 3
Stéphane Dauzère-Pérès
1, 2
Claude Yugma
1, 2
Lionel Rulliere
3
Gilles Lamiable
3
Moulaye Aidara Ndiaye 1, 2, 3
Author
Stéphane Dauzère-Pérès 1, 2
Author IdHAL : stephane-dauzere-peres
Claude Yugma 1, 2
Author
Lionel Rulliere 3
Author
Gilles Lamiable 3
Author
1
SFL-ENSMSE - Département Sciences de la Fabrication et Logistique (880, route de Mimet 13541 Gardanne - France)
- Mines Saint-Étienne MSE - École des Mines de Saint-Étienne (158, Cours Fauriel - 42023 Saint Étienne cedex 2 - France)
- IMT - Institut Mines-Télécom [Paris] (37-39 Rue Dareau, 75014 Paris - France)
- CMP-GC (France)
2
LIMOS - Laboratoire d'Informatique, de Modélisation et d'Optimisation des Systèmes (Campus Universitaire des Cézeaux, 1 rue de la Chebarde, TSA 60125 / CS 60026, 63178 Aubière Cedex - France)
- Ecole Nationale Supérieure des Mines de St Etienne : UMR6158 (France)
- CNRS - Centre National de la Recherche Scientifique : UMR6158 (France)
- UCA [2017-2020] - Université Clermont Auvergne [2017-2020] : UMR6158 (49, bd François-Mitterrand / CS 60032 / 63001 Clermont-Ferrand Cedex 1 - France)
3
ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)
Document type :
Conference papers
Domain :
Complete list of metadata
https://hal-emse.ccsd.cnrs.fr/emse-01792280
Contributor : Stéphane Dauzère-Pérès Connect in order to contact the contributor
Submitted on : Tuesday, May 15, 2018 - 12:54:56 PM
Last modification on : Wednesday, February 24, 2021 - 4:24:02 PM
Contributor : Stéphane Dauzère-Pérès Connect in order to contact the contributor
Submitted on : Tuesday, May 15, 2018 - 12:54:56 PM
Last modification on : Wednesday, February 24, 2021 - 4:24:02 PM
Identifiers
- HAL Id : emse-01792280, version 1
- DOI : 10.1109/ASMC.2016.7491112
Collections
EMSE | INSTITUT-TELECOM | SFL-ENSMSE | CNRS | LIMOS | PRES_CLERMONT
Citation
Moulaye Aidara Ndiaye, Stéphane Dauzère-Pérès, Claude Yugma, Lionel Rulliere, Gilles Lamiable. Management of crisis situations in a large unified AMHS of a semiconductor manufacturing facility: IE: Industrial engineering. 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), May 2016, Saratoga Springs, United States. ⟨10.1109/ASMC.2016.7491112⟩. ⟨emse-01792280⟩
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