Conference Papers
Year : 2014
Stéphane Dauzère-Pérès : Connect in order to contact the contributor
https://hal-emse.ccsd.cnrs.fr/emse-01792292
Submitted on : Tuesday, May 15, 2018-1:01:06 PM
Last modification on : Wednesday, August 28, 2024-3:09:43 AM
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Sylvain Housseman, Stéphane Dauzère-Pérès, Gloria Rodriguez-Verjan, Jacques Pinaton. Smart dynamic sampling for wafer at risk reduction in semiconductor manufacturing. 2014 IEEE International Conference on Automation Science and Engineering (CASE), Aug 2014, Taipei, Taiwan. ⟨10.1109/CoASE.2014.6899414⟩. ⟨emse-01792292⟩
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