Smart dynamic sampling for wafer at risk reduction in semiconductor manufacturing - Mines Saint-Étienne Access content directly
Conference Papers Year : 2014

Smart dynamic sampling for wafer at risk reduction in semiconductor manufacturing

Domains

Operations Research [math.OC]

Stéphane Dauzère-Pérès  : Connect in order to contact the contributor

https://hal-emse.ccsd.cnrs.fr/emse-01792292

Submitted on : Tuesday, May 15, 2018-1:01:06 PM

Last modification on : Wednesday, August 28, 2024-3:09:43 AM

No file

Dates and versions

emse-01792292 , version 1 (15-05-2018)

Identifiers

Cite

Sylvain Housseman, Stéphane Dauzère-Pérès, Gloria Rodriguez-Verjan, Jacques Pinaton. Smart dynamic sampling for wafer at risk reduction in semiconductor manufacturing. 2014 IEEE International Conference on Automation Science and Engineering (CASE), Aug 2014, Taipei, Taiwan. ⟨10.1109/CoASE.2014.6899414⟩. ⟨emse-01792292⟩

Export

BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite

Collections

EMSE PRES_CLERMONT CNRS SFL-ENSMSE LIMOS TDS-MACS CLERMONT-AUVERGNE-INP
43 View
0 Download

Altmetric

Share

Gmail Mastodon Facebook X LinkedIn More