Conference Papers
Year : 2010
Stéphane Dauzère-Pérès : Connect in order to contact the contributor
https://hal-emse.ccsd.cnrs.fr/emse-01792330
Submitted on : Tuesday, May 15, 2018-1:24:04 PM
Last modification on : Tuesday, September 17, 2024-3:46:13 PM
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Stéphane Dauzère-Pérès, Jean-Loup Rouveyrol, Claude Yugma, Philippe Vialletelle. A smart sampling algorithm to minimize risk dynamically. 2010 21st Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC), Jul 2010, San Francisco, France. ⟨10.1109/ASMC.2010.5551470⟩. ⟨emse-01792330⟩
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