A smart sampling algorithm to minimize risk dynamically - Mines Saint-Étienne
Conference Papers Year : 2010
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emse-01792330 , version 1 (15-05-2018)

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Stéphane Dauzère-Pérès, Jean-Loup Rouveyrol, Claude Yugma, Philippe Vialletelle. A smart sampling algorithm to minimize risk dynamically. 2010 21st Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC), Jul 2010, San Francisco, France. ⟨10.1109/ASMC.2010.5551470⟩. ⟨emse-01792330⟩
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