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The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks

Jean-Max Dutertre 1, 2 Vincent Beroulle 3 Philippe Candelier 4 Louis-Barthelemy Faber 4 Marie-Lise Flottes 5 Philippe Gendrier 4 David Hely 3 Régis Leveugle 6 Paolo Maistri 6 Giorgio Di Natale 5 Athanasios Papadimitriou 3 Bruno Rouzeyre 5
1 SAS-ENSMSE - Département Systèmes et Architectures Sécurisés
2 Mines Saint-Étienne MSE - École des Mines de Saint-Étienne
3 LCIS [2016-2019] - Laboratoire de Conception et d'Intégration des Systèmes [2016-2019]
4 ST-CROLLES - STMicroelectronics [Crolles]
5 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
6 TIMA [2007-2015] - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés [2007-2015]
Abstract : At first used to emulate the effects of radioactive ionizing particules passing through integrated circuits (ICs), laser illumination is also used to inject faults into the computations of secure ICs for the purpose of retrieving secret data. The CMOS FD-SOI technology is expected to be less sensitive to laser faults injection than the more usual CMOS bulk technology. We report in this work an experimental assessment of the interest of using FD-SOI rather than CMOS bulk to decrease laser sensitivity. Our experiments were conducted on test chips at the 28 nm node for both technologies with laser pulse durations in the picosecond and nanosecond ranges.
Keywords : FD-SOI Laser Fault injection Index Terms-Laser fault injection CMOS bulk
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https://hal-emse.ccsd.cnrs.fr/emse-01856000
Contributor : Jean-Max Dutertre <>
Submitted on : Tuesday, June 18, 2019 - 3:53:28 PM
Last modification on : Tuesday, August 4, 2020 - 8:19:18 AM

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EMSE | CYBERALPS | UNIV-MONTPELLIER | MIPS | MIC | LIRMM_MIC | TEST | LIRMM | LCIS | SAS-ENSMSE | TIMA | CNRS | UGA | INSTITUT-TELECOM | PARISTECH

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Jean-Max Dutertre, Vincent Beroulle, Philippe Candelier, Louis-Barthelemy Faber, Marie-Lise Flottes, et al.. The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks. IOLTS: International On-Line Testing Symposium, Jul 2018, Platja d’Aro, Spain. pp.214-219, ⟨10.1109/IOLTS.2018.8474230⟩. ⟨emse-01856000⟩

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