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LED Failure Localization Method due to Thermal Shock and Residual Stress Impact

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Conference papers
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https://hal-emse.ccsd.cnrs.fr/emse-02016680
Contributor : Géraldine Fournier-Moulin <>
Submitted on : Tuesday, February 12, 2019 - 7:07:01 PM
Last modification on : Wednesday, June 24, 2020 - 4:19:27 PM

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  • HAL Id : emse-02016680, version 1

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S. Nocairi, C. Roucoules, S. Sao-Joao, G. Kermouche, H. Klöcker. LED Failure Localization Method due to Thermal Shock and Residual Stress Impact. 2018 7th Electronic System-Integration Technology Conference (ESTC), Sep 2018, Dresden, Germany. pp.1-6. ⟨emse-02016680⟩

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