Multi-scale in-situ micro-mechanical characterization of Polymer Core Solder Ball (PCSB) coatings for BGA interconnections - Mines Saint-Étienne
Journal Articles Microelectronics Reliability Year : 2023

Multi-scale in-situ micro-mechanical characterization of Polymer Core Solder Ball (PCSB) coatings for BGA interconnections

Abstract

In the field of electronic packaging, the manufacturing processes involve electroless plating. The microstructure of these materials differs from bulk materials, so do their mechanical properties. However, bulk material properties are commonly attributed to them. This paper is focused on the characterization of the mechanical properties of a multilayer coating of copper and nickel–phosphorus deposited on a Polymer Core Solder Ball (PCSB) used for BGA (Ball Grid Array) connections. In this coating, the copper is nanocrystalline, while the nickel–phosphorus is amorphous. In order to understand the influence of these microstructural differences on the mechanical properties of the PCSB, a multiscale study is performed. First, at the microscopical scale, the characterization of the mechanical properties (Young modulus (E) and Yielding strength (σ)) of two coatings (Cu, Ni-P) is conducted. For this purpose, insitu micro-mechanical tests (Micro pillar compression and nanoindentation) are carried out. Then, at the mesoscopical scale, the previous properties are validated by applying a compressive loading to a PCSB solder ball. A correlation between the numerical and experimental approaches is performed and revealed that the coating properties are different from those of the bulk material.
Fichier principal
Vignette du fichier
IM_SSJ Microelectronics Reliability 2023.pdf (8.44 Mo) Télécharger le fichier
Origin Files produced by the author(s)

Dates and versions

emse-04186045 , version 1 (11-03-2024)

Identifiers

Cite

Irati Malkorra, Sergio Sao Joao, U. Costa, D. Chalavoux, S. Bucher, et al.. Multi-scale in-situ micro-mechanical characterization of Polymer Core Solder Ball (PCSB) coatings for BGA interconnections. Microelectronics Reliability, 2023, 148, pp.115135. ⟨10.1016/j.microrel.2023.115135⟩. ⟨emse-04186045⟩
56 View
27 Download

Altmetric

Share

More