A Novel Approach to Minimize the number of Controls in Defectivity Area (13th Technical Meeting of ARCSIS, Rousset 2010)

Justin Nduhura Munga; Claude Yugma; Stéphane Dauzère-Pérès; Philippe Vialletelle

A Novel Approach to Minimize the number of Controls in Defectivity Area (13th Technical Meeting of ARCSIS, Rousset 2010)

Justin Nduhura Munga ^{1, 2} Claude Yugma ¹ Stéphane Dauzère-Pérès ¹ Philippe Vialletelle ²

1 SFL-ENSMSE - Département Sciences de la Fabrication et Logistique

2 ST-CROLLES - STMicroelectronics [Crolles]

Abstract : The paper introduces a novel approach to minimize the number of controls in the Defectivity area

Keywords : Defectivity Controls Dynamic Sampling

Document type :

Preprints, Working Papers, ...

Domain :

Engineering Sciences [physics] / Electronics

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https://hal-emse.ccsd.cnrs.fr/emse-00605651
Contributor : Justin Nduhura <>
Submitted on : Sunday, July 3, 2011 - 3:15:05 PM
Last modification on : Monday, February 25, 2019 - 10:26:16 AM
Long-term archiving on : Tuesday, October 4, 2011 - 2:21:11 AM

ARCSIS_ABSTRACT_2010_V2_1_.pdf

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A Novel Approach to Minimize the number of Controls in Defectivity Area (13th Technical Meeting of ARCSIS, Rousset 2010)

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