Evidence of a larger EM-induced fault model

Abstract : Electromagnetic waves have been recently pointed out as a medium for fault injection within circuits featuring cryptographic mod- ules. Indeed, it has been experimentally demonstrated by A. Dehbaoui et al. (Injection of transient faults using electromagnetic pulses - practical results on a cryptographic system, IACR Cryptology ePrint Archive 2012) that an electromagnetic pulse, produced with a high voltage pulse generator and a probe similar to that used to perform EM analyses, was susceptible to create faults exploitable from a cryptanalysis viewpoint. An analysis of the induced faults (Dehbaoui et al., Electro-magnetic transient faults injection on a hardware and a software implementations of aes. In FDTC, 2012) revealed that they originated from timing constraint violations. This paper experimentally demonstrates that EM injection, performed with enhanced probes is very local and can produce not only timing faults but also bit-set and bit-reset faults. This result clearly extends the range of the threats associated with EM fault injection.
Type de document :
Communication dans un congrès
CARDIS: Smart Card Research and Advanced Application, Nov 2014, Paris, France. 13th Smart Card Research and Advanced Application Conference, LNCS (8968), pp.245-259, 2015, Smart Card Research and Advanced Applications. 〈http://cedric.cnam.fr/events/cardis/〉. 〈10.1007/978-3-319-16763-3_15〉
Liste complète des métadonnées

https://hal-emse.ccsd.cnrs.fr/emse-01099037
Contributeur : Jean-Max Dutertre <>
Soumis le : mardi 30 décembre 2014 - 17:47:00
Dernière modification le : jeudi 11 janvier 2018 - 02:08:13

Identifiants

Citation

Sébastien Ordas, Ludovic Guillaume-Sage, Karim Tobich, Jean-Max Dutertre, Philippe Maurine. Evidence of a larger EM-induced fault model. CARDIS: Smart Card Research and Advanced Application, Nov 2014, Paris, France. 13th Smart Card Research and Advanced Application Conference, LNCS (8968), pp.245-259, 2015, Smart Card Research and Advanced Applications. 〈http://cedric.cnam.fr/events/cardis/〉. 〈10.1007/978-3-319-16763-3_15〉. 〈emse-01099037〉

Partager

Métriques

Consultations de la notice

138