Analysis of a fault injection mechanism related to voltage glitches using an on-chip voltmeter

Loïc Zussa 1 Jean-Max Dutertre 1 Jessy Clédière 2 Bruno Robisson 3
1 SAS-ENSMSE - Département Systèmes et Architectures Sécurisés
2 CEA-LETI - Laboratoire d'Electronique et des Technologies de l'Information
3 Laboratoire Systèmes et Architectures Sécurisés (LSAS)
SAS-ENSMSE - Département Systèmes et Architectures Sécurisés, CEA-TECH-Reg - CEA Tech en régions
Abstract : Analysis of a fault injection mechanism related to voltage glitches using an on-chip voltmeter
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Conference papers
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https://hal-emse.ccsd.cnrs.fr/emse-01099039
Contributor : Jean-Max Dutertre <>
Submitted on : Friday, January 9, 2015 - 3:00:24 PM
Last modification on : Monday, February 25, 2019 - 4:34:19 PM

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  • HAL Id : emse-01099039, version 1

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EMSE | CEA | INSTITUT-TELECOM | SAS-ENSMSE | DRT | LETI | CEA-GRE

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Loïc Zussa, Jean-Max Dutertre, Jessy Clédière, Bruno Robisson. Analysis of a fault injection mechanism related to voltage glitches using an on-chip voltmeter. TRUDEVICE Workshop (colocated with ETS 2014), May 2014, Paderborn, Germany. ⟨emse-01099039⟩

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