Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection

Abstract : Bulk Built-In Current Sensors (BBICSs) are able to detect anomalous transient currents induced in the bulk of integrated circuits when hit by ionizing particles. This paper presents a new strategy to design BBICSs with optimal transient-fault detection sensitivity while keeping low both area and power overheads. The approach allows increasing the detection sensitivity by setting an asymmetry in the flipping ability of the sensor's latch. In addition, we introduce a mechanism to tune the delay of the bulk access transistors that improves even more the BBICS detection sensitivity. The proposed design strategy offers a good compromise between fault detection sensitivity and power consumption; moreover it makes feasible the use of several CMOS processes.
Type de document :
Article dans une revue
Microelectronics Reliability, Elsevier, 2013, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 53 (9), pp.1320-1324. 〈10.1016/j.microrel.2013.07.069〉
Liste complète des métadonnées

Littérature citée [4 références]  Voir  Masquer  Télécharger

https://hal-emse.ccsd.cnrs.fr/emse-01100723
Contributeur : Jean-Max Dutertre <>
Soumis le : mardi 6 janvier 2015 - 20:42:20
Dernière modification le : mercredi 5 septembre 2018 - 01:11:44
Document(s) archivé(s) le : mercredi 3 juin 2015 - 17:35:43

Fichier

HAL_MR_2013_Sensitivity_Tuning...
Fichiers produits par l'(les) auteur(s)

Identifiants

Citation

Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, et al.. Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection. Microelectronics Reliability, Elsevier, 2013, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 53 (9), pp.1320-1324. 〈10.1016/j.microrel.2013.07.069〉. 〈emse-01100723〉

Partager

Métriques

Consultations de la notice

396

Téléchargements de fichiers

501