Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection

Jean-Max Dutertre 1 Rodrigo Possamai Bastos 2 Olivier Potin 3 Marie-Lise Flottes 4 Bruno Rouzeyre 4 Giorgio Di Natale 4
1 SAS-ENSMSE - Département Systèmes et Architectures Sécurisés
2 TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture
3 LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
4 TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : Bulk Built-In Current Sensors (BBICSs) are able to detect anomalous transient currents induced in the bulk of integrated circuits when hit by ionizing particles. This paper presents a new strategy to design BBICSs with optimal transient-fault detection sensitivity while keeping low both area and power overheads. The approach allows increasing the detection sensitivity by setting an asymmetry in the flipping ability of the sensor's latch. In addition, we introduce a mechanism to tune the delay of the bulk access transistors that improves even more the BBICS detection sensitivity. The proposed design strategy offers a good compromise between fault detection sensitivity and power consumption; moreover it makes feasible the use of several CMOS processes.
Keywords : Laser Security Sensor Integrated circuit
Type de document :
Article dans une revue
Microelectronics Reliability, Elsevier, 2013, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 53 (9), pp.1320-1324. 〈10.1016/j.microrel.2013.07.069〉
Liste complète des métadonnées

Littérature citée [4 références]  Voir  Masquer  Télécharger
https://hal-emse.ccsd.cnrs.fr/emse-01100723
Contributeur : Jean-Max Dutertre <>
Soumis le : mardi 6 janvier 2015 - 20:42:20
Dernière modification le : lundi 7 janvier 2019 - 14:12:05
Document(s) archivé(s) le : mercredi 3 juin 2015 - 17:35:43

Fichier

HAL_MR_2013_Sensitivity_Tuning...
Fichiers produits par l'(les) auteur(s)

Identifiants

Collections

EMSE | TIMA | SAS-ENSMSE | UGA | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER | TEST

Citation

Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, et al.. Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection. Microelectronics Reliability, Elsevier, 2013, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 53 (9), pp.1320-1324. 〈10.1016/j.microrel.2013.07.069〉. 〈emse-01100723〉

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

451

Téléchargements de fichiers

599

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD