Discussion on the Model of Laser Induced Faults in SRAM Memory cells

Abstract : Discussion on the Model of Laser Induced Faults in SRAM Memory cells
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https://hal-emse.ccsd.cnrs.fr/emse-01109302
Contributor : Jean-Max Dutertre <>
Submitted on : Wednesday, January 28, 2015 - 1:26:33 PM
Last modification on : Thursday, February 7, 2019 - 4:01:46 PM

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Cyril Roscian, Alexandre Sarafianos, Jean-Max Dutertre, Assia Tria, Mathieu Lisart. Discussion on the Model of Laser Induced Faults in SRAM Memory cells. Forth International Workshop on Constructive Side-Channel Analysis and Secure Design, COSADE 2013, Mar 2013, Paris, France. ⟨emse-01109302⟩

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