Laser Fault Injection into SRAM cells: Picosecond versus Nanosecond pulses
Résumé
—Laser fault injection into SRAM cells is a widely used technique to perform fault attacks. In previous works, Roscian and Sarafianos studied the relations between the layout of the cell, its different laser-sensitive areas and their associated fault model using 50 ns duration laser pulses. In this paper, we report similar experiments carried out using shorter laser pulses (30 ps duration instead of 50 ns). Laser-sensitive areas that did not appear at 50 ns were observed. Additionally, these experiments confirmed the validity of the bit-set/bit-reset fault model over the bit-flip one. We also propose an upgrade of the simulation model they used to take into account laser pulses in the picosecond range. Finally, we performed additional laser fault injection experiments on the RAM memory of a microcontroller to validate the previous results.
Fichier principal
hal_IOLTS_2015_laser_Pico_vs_Nano_SRAM.pdf (2.64 Mo)
Télécharger le fichier
C_2015_2_talk_Laser_Fault_Injection_into_SRAM_cells_Picosecond_versus_Nanosecond_pulses_IOLTS.pdf (2.67 Mo)
Télécharger le fichier
| Origine | Fichiers produits par l'(les) auteur(s) |
|---|
| Origine | Fichiers produits par l'(les) auteur(s) |
|---|
Loading...